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Taiwan Academic Institutional Repository >
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"王維新"
Showing items 76-82 of 82 (4 Page(s) Totally)
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| 國立臺灣大學 |
1986 |
Relationship Between Mobile Charges and Interface Trap States in Silicon MOS Capacitors
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胡振國; 王維新; Chiou, Y. L.; Hwu, Jenn-Gwo; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1986 |
The Effect of Postoxidation Cooling on Oxygen on the Interface Property of MOS Capacitors
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胡振國; Chang, J. J.; 王維新; Hwu, Jenn-Gwo; Chang, J. J.; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Radiation Effects on the Oxide Properties of Silicon MOS Capacitor
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胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen |
| 國立臺灣大學 |
1985 |
The Effect of Charge-Temperature Aging on n-MOSFET
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胡振國; Lin, C. M.; 王維新; Hwu, Jenn-Gwo; Lin, C. M.; Wang, Way-Seen |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 臺大學術典藏 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;Lin, Hao-Hsiung;Wang, Way-Seen;Chiou, Y. L.; Chang, C. Y.; 林浩雄; 林浩雄; 王維新; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Lin, Hao-Hsiung; Wang, Way-Seen; Wang, Way-Seen; Chiou, Y. L.; Chiou, Y. L. |
Showing items 76-82 of 82 (4 Page(s) Totally)
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