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"王維新"的相关文件
显示项目 61-82 / 82 (共2页)
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| 國立臺灣大學 |
1993 |
固相離子交換光波導之研製（中型儀器）
|
王維新 |
| 國立臺灣大學 |
1993 |
耦合式非對稱馬赫任德干涉器之研製
|
王維新 |
| 國立臺灣大學 |
1991 |
低電壓任意極化鈮酸鋰光開關之研製
|
王維新 |
| 國立臺灣大學 |
1991 |
微波帶通光調制器之研究
|
王維新 |
| 國立臺灣大學 |
1990 |
Single and Mulitiple AlGaAs Quantum-Well Structures Grown by Liquid-Phase Epitaxy
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Chen, J. A.; Wang, Cheng-Kun; 林浩雄; 王維新; 李嗣涔; Chen, J. A.; Wang, Cheng-Kun; 林浩雄; 王維新; Lee, Si-Chen |
| 臺大學術典藏 |
1990 |
Single and Mulitiple AlGaAs Quantum-Well Structures Grown by Liquid-Phase Epitaxy
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林浩雄; 王維新; 李嗣涔; Chen, J. A.; Wang, Cheng-Kun; 林浩雄; 王維新; 李嗣涔; 林浩雄; Lee, Si-Chen |
| 國立臺灣大學 |
1989 |
Reliable C-V Characterization of MOS Capacitors by Initial Treatment at the Presence of Slow Interface States
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胡振國; Lin, J. J.; 王維新; Hwu, Jenn-Gwo; Lin, J. J.; Wang, Way-Seen |
| 國立臺灣大學 |
1988 |
Residual Charges Effect on the Annealing Behavior of Co-60 Irradiated MOS Capacitors
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胡振國; Lee, G. S.; 李嗣涔; 王維新; 胡振國; Lee, G. S.; 李嗣涔; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Charge Temperature Effects on Co-60 Irradiated Mos Capacitors
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Lee, G. S.; 胡振國; 李嗣涔; 王維新; Lee, G. S.; 胡振國; 李嗣涔; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide
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胡振國; Jeng, M. J.; 王維新; Tu, Y. K.; Hwu, Jenn-Gwo; Jeng, M. J.; Wang, Way-Seen; Tu, Y. K. |
| 國立臺灣大學 |
1987 |
Interface Properties of Al/Ta205/Si02/Si (P) Capacitor
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Studies of the Radiation-Hardening CMOS Processes
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胡振國; 李嗣涔; 王維新; Hwu, Jenn-Gwo; Lee, Si-Chen; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Direct Indication of Interface Trap States in a MOS Capacitor from the Peaks of Optical Illumination-Induced Capacitances
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 臺大學術典藏 |
1987 |
Charge Temperature Effects on Co-60 Irradiated Mos Capacitors
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Lee, G. S.;胡振國;李嗣涔;王維新; Lee, G. S.;胡振國;李嗣涔;Wang, Way-Seen; Lee, G. S.; 胡振國; 李嗣涔; 王維新; 胡振國; 李嗣涔; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Direct Indication of Lateral Nonuniformities of MOS Capacitors from the Negative Equivalent Interface Trap Density Based on Charge-Temperature Technique
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胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Relationship Between Mobile Charges and Interface Trap States in Silicon MOS Capacitors
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胡振國; 王維新; Chiou, Y. L.; Hwu, Jenn-Gwo; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1986 |
The Effect of Postoxidation Cooling on Oxygen on the Interface Property of MOS Capacitors
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胡振國; Chang, J. J.; 王維新; Hwu, Jenn-Gwo; Chang, J. J.; Wang, Way-Seen |
| 國立臺灣大學 |
1986 |
Radiation Effects on the Oxide Properties of Silicon MOS Capacitor
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胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen |
| 國立臺灣大學 |
1985 |
The Effect of Charge-Temperature Aging on n-MOSFET
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胡振國; Lin, C. M.; 王維新; Hwu, Jenn-Gwo; Lin, C. M.; Wang, Way-Seen |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 國立臺灣大學 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.; 林浩雄; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Wang, Way-Seen; Chiou, Y. L. |
| 臺大學術典藏 |
1981 |
High Frequency Characteristics of Some Thick Film Components
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Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;林浩雄;王維新;Chiou, Y. L.; Chang, C. Y.;Lin, Hao-Hsiung;Wang, Way-Seen;Chiou, Y. L.; Chang, C. Y.; 林浩雄; 林浩雄; 王維新; 王維新; Chiou, Y. L.; Chang, C. Y.; Lin, Hao-Hsiung; Lin, Hao-Hsiung; Wang, Way-Seen; Wang, Way-Seen; Chiou, Y. L.; Chiou, Y. L. |
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