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"葉榮輝"
Showing items 1-10 of 28 (3 Page(s) Totally)
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| 亞洲大學 |
2022-03-01 |
Effects of Mg doping on structural and optoelectronic properties of p-type semiconductor CuCrO2 thin films
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林士弘;Lin, Shih-Hung;葉榮輝;YEH, RONG-HWEI;朱辰;Chu, Chen;游瑞松;Yu, Ruei-Sung |
| 亞洲大學 |
2021 |
CMS 實驗：Run-Ⅲ、物理分析及高粒度量能器建造
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郭家銘; 葉榮輝;YEH, RONG-HWEI |
| 亞洲大學 |
2020 |
CMS Run II/III 物理分析及偵測器的研發測試--矽探測器讀出系統研製
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林志勳; 葉榮輝;YEH, RONG-HWEI;郭家銘 |
| 亞洲大學 |
2020 |
CMS Run II/III 物理分析及偵測器的研發測試--總計畫暨子計畫一:CMS 暗物質物理分析以及SiFCC偵測器的開發研究
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余欣珊; 葉榮輝;YEH, RONG-HWEI;郭家銘;林宗泰;林志勳 |
| 亞洲大學 |
2015/05 |
Key Engineering Materials
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葉榮輝; YEH, RONG-HWEI;C.K.Lee, C.K.Lee;A.H.Tan; A.H.Tan |
| 亞洲大學 |
2015/02 |
SURFACE ENGINEERING
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葉榮輝; YEH, RONG-HWEI;T.M.Chao;T.M.Chao; |
| 亞洲大學 |
2015-05 |
A Novel Tape and Diamond Process Developed for Polishing Hard Substrates
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葉榮輝;YEH, RONG-HWEI;Tsung-Ming, C;Chao, Tsung-Ming;C.K.Lee;C.K.Lee;A.H.Tan;A.H.Tan |
| 亞洲大學 |
2015-05 |
Study of Electroplated Nickel Layer Thickness and Saw Parameters on Cutting Performance in Diamond Wire Sawing of Sapphire Ingots
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葉榮輝;YEH, RONG-HWEI;H.Y.Chen;H.Y.Chen;C.K.Lee;C.K.Lee;A.H.Tan;A.H.Tan |
| 亞洲大學 |
2015-05 |
Study of Electroplated Nickel Layer Thickness and Saw Parameters on Cutting Performance in Diamond Wire Sawing of Sapphire Ingots
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葉榮輝;YEH, RONG-HWEI;H. Y. Chen;H. Y.Chen;C. K. Lee;C. K.Lee;A. H. Tan;A. H.Tan |
| 亞洲大學 |
2015-02 |
Optimization of DLC deposition parameters for magnetic and reliability properties
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葉榮輝;YEH, RONG-HWEI;T.M.Chao;T.M.Chao;TAN, AN HUNG;TAN, AN HUNG |
Showing items 1-10 of 28 (3 Page(s) Totally)
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