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Institution	Date	Title	Author
亞洲大學	2015-03	Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stree	蔡宗叡；Jung-Ruey Tsai；Ting-Ting Wen；楊紹明；Shao-Ming Yang；許健；Gene Sheu；Ruey-Dar Chang；Yi-Jhen Syu； Chin-Ping Liu；Hsiu-Fu Chang；Zhao-Hui Wei

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