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"蔡宗叡 tsai jung ruey"???jsp.browse.items-by-author.description???
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| 亞洲大學 |
201506 |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stress
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蔡宗叡(TSAI, JUNG-RUEY); 楊紹明(Shao-Ming Yang); 許健(Gene Sheu); Ruey Dar Cha(Ruey Dar Chang); Ting Ting We(Ting Ting Wen) |
| 亞洲大學 |
2015-06 |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stress
|
蔡宗叡(TSAI, JUNG-RUEY);Yang), 楊紹明(Shao-Ming;Sheu), 許健(Gene;Chang), Ruey Dar Cha(Ruey Dar;Wen), Ting Ting We(Ting Ting |
| 亞洲大學 |
2015-03 |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD
|
蔡宗叡(TSAI, JUNG-RUEY);Yang), 楊紹明(Shao-Ming;Sheu), 許健(Gene |
| 亞洲大學 |
2014-03 |
A Gate-All-Around Floating-Gate Memory Device with Triangular-Shaped Poly-Si Nanowire Channels
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蔡宗叡(TSAI, JUNG-RUEY)*; 李克慧(Lee, Ko-Hui Lee); 林鴻志(Lin, Horng-Chih); 黃調元(Huang, Tiao-Yuan) |
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