English  |  正體中文  |  简体中文  |  2818357  
???header.visitor??? :  28042341    ???header.onlineuser??? :  1295
???header.sponsordeclaration???
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???

???ui.leftmenu.bartitle???

???index.news???

???ui.leftmenu.copyrighttitle???

???ui.leftmenu.link???

"高至誠"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 11-27 of 27  (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page

Institution Date Title Author
南台科技大學 2007 FED 低壓螢光體發光特性之研究 涂國平; 張淑美; 高至誠; 高逢時
南台科技大學 2006 用於場發射顯示器之銦酸鹽類與鍺酸鹽類螢光粉之開發與特性研究 高至誠;Kao, Chih-Cheng
南台科技大學 2006 FED 螢光粉發光特性之研究 涂國平; 張淑美; 高至誠; 高逢時
南台科技大學 2006 Erbium dopes SiOx film : annealing-induced evolution on structural and optical properties 高至誠; C. C. Kao; B. Gallas; J. Rivory
南台科技大學 2006 Optical properties of silicon nanocrystal embedded in SiO2 thin films 高至誠; C. C. Kao; B. Gallas; J. Rivory
南台科技大學 2005 Optical properties of Si nanocrystals embedded in SiO2 高至誠; B. Gallas; I. Stenger; C.-C. Kao; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2005 Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO2 films 高至誠; C.-C. Kao; C. Barthou; B. Gallas; S. Fisson; G. Vuye; J. Rivory; A. Al Choueiry; A.-M. Jurdyc; Jacquier; L. Bigot
南台科技大學 2004 Dielectric function of Si nanocrystals embedded in SiO2 高至誠; B. Gallas; C.-C. Kao; C. efranoux; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2004 Determination of effective absorption cross section of erbium in SiO2 films containing nc-Si 高至誠; C.-C. Kao; L. Bigot; A.-M. Jurdyc; B. Jacquier; B. Gallas; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2004 Near band gap absorption of Si nanocrystals in SiO2 investigated by spectroscopic ellipsometry and photothermal deflection spectroscopy 高至誠; L. Siozade; I. Stenger; B. Gallas; C.-C. Kao; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2003 In situ control of SiOx composition by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of erbium doped SiO2 thin films containing Si nanocrystals 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 In situ control of SiOx stoechiometry by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Dielectric function of Si dots embedded in SiO2 高至誠; B. Gallas; C.-C. Kao; C. Defranoux; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of SiO2 thin films doped with Si nano-grains and erbium 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2002 Laser annealing of SiOx thin films 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory; Y. Bernard; C. Belouet
南台科技大學 2002 Phase-Shifting Algorithms for Electronic Speckle Pattern Interferometry 高至誠; C.-C. Kao; Gym-Bin Yeh; Shu-Sheng Lee; Chih-Kung Lee; Ching-Sang Yang; Kuang-Chong Wu

Showing items 11-27 of 27  (2 Page(s) Totally)
1 2 > >>
View [10|25|50] records per page