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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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2019臺灣學術機構典藏
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Showing items 31-39 of 39  (2 Page(s) Totally)
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Institution Date Title Author
國立高雄師範大學 2002-08 快速熱製程中熱輻射對超薄氧化層膜金氧半元件影響之研究 黃嘉宏; Chia-Hong Huang
元智大學 2002 校園網路使用與學生學業成績之關聯性研究 黃嘉宏; Jia-Hung Huang
國立高雄師範大學 2002 Effect of Mechanical Stress on the Characteristics of Silicon Thermal Oxides Chia-Hong Huang;Jui-Yuan Yen;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2001 Breakdown Characteristics of Ultra-thin Gate Oxide ( < 4nm ) in MOS Structure Subjected Substrate Injection Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2001 Anomalous Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) after High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2000 Enhancement in Soft Breakdown Occurrence on Ultra-thin Gate Oxides Caused by Photon Effect in Rapid Thermal Post Oxidation Annealing Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學 2000 Role of Interface Trap Generation in the Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) under High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
中國醫藥大學 2000 基於自動分類為基礎的圖書題名特徵擷取之研究-以輔助圖書分類系統為例 黃嘉宏; Huang, Jia-Hon
國立高雄師範大學 1999 The Breakdown Properties of Front- and Back-side Post Oxidation Annealed( POA ) Ultrathin Gate Oxide ( <3nm ) under High Field Stress Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏

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