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| 國立成功大學 |
2006-07 |
Error signal artifact in apertureless scanning near-field optical microscopy
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Billot, L.; �� Lamy de la Chapelle, M.; �� Barchiesi, D.; �Chang,� Shih-Hui; �� Gray, S. K.; �� Rogers, J. A.; �� Bouhelier, A.; �� Adam, P. M.; �� Bijeon, J. L.; �� Wiederrecht, G. P.; �� Bachelot, R.; �� Royer, P. |
| 國立成功大學 |
2005-04 |
Near-field photochemical imaging of noble metal nanostructures
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Hubert, Christophe; �Rumyantseva, Anna; Lerondel, Gilles; Grand, Johan; Kostcheev, Serge�; Billot, Laurent; Vial, Alexandre; Bachelot, Renaud; Royer, Pascal; �Chang,� Shih-Hui; �Stephen K. Gray; �� Wiederrecht, G. P.; Schatz, G. C. |
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