臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 1-10 of 48 (5 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2019-10-31T07:36:58Z	Blood vessel extraction from OCT data by short-time RPCA	SHENG-LUNG HUANG;H. H. Chen;A. Chen;S. L. Huang;C.-C. Chan;P.-H. Lee; P.-H. Lee; C.-C. Chan; S. L. Huang; A. Chen; H. H. Chen; SHENG-LUNG HUANG
臺大學術典藏	2019-10-31T07:05:45Z	Extracting blood vessels from full-field OCT data of human skin by short-time RPCA	HOMER H. CHEN; H. H. Chen; S.-L. Huang; A. Chen; HOMER H. CHEN;H. H. Chen;A. Chen;S.-L. Huang;C.-C. Chan;P.-H. Lee; P.-H. Lee; C.-C. Chan
臺大學術典藏	2019-10-31T07:05:45Z	Extracting blood vessels from full-field OCT data of human skin by short-time RPCA	HOMER H. CHEN;H. H. Chen;A. Chen;S.-L. Huang;C.-C. Chan;P.-H. Lee; P.-H. Lee; C.-C. Chan; S.-L. Huang; A. Chen; H. H. Chen; HOMER H. CHEN
臺大學術典藏	2018-09-10T07:44:18Z	Self-tuning EWMA Mean Estimate and its Application in R2R Control	RUEY-SHAN GUO;J. Chen;A. Chen; RUEY-SHAN GUO; J. Chen; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:17Z	Real-time Equipment Health Evaluation and Prognosis	RUEY-SHAN GUO;G. Wu;A. Chen; RUEY-SHAN GUO; G. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:17Z	Modeling, Optimization and Control of Wafer-level Spatial Uniformity for Rapid Thermal Oxidation of Silicon Process	RUEY-SHAN GUO;M. Lan;A. Lin;A. Chen; RUEY-SHAN GUO; M. Lan; A. Lin; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:17Z	Equipment Health Index and Real-time Monitoring	RUEY-SHAN GUO;A. Chen; RUEY-SHAN GUO; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:17Z	Network Ready Semiconductor Manufacturing Cluster Tool	RUEY-SHAN GUO;A. Chen;C. Weng;S. Chang;P. Chang;C. Liu;C. Lu;S. Lee,;H. Huang;S. Lu; RUEY-SHAN GUO; A. Chen; C. Weng; S. Chang; P. Chang; C. Liu; C. Lu; S. Lee,; H. Huang; S. Lu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:16Z	Function Decomposition and Cost Modeling for Wafer Manufacturing	RUEY-SHAN GUO;A. Chen; RUEY-SHAN GUO; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:15Z	A Self-Tuning Run-by-Run Process Controller for Processes subject to Random Disturbances	RUEY-SHAN GUO;S. Lu;A. Chen,;J. Chen;R. Guo; RUEY-SHAN GUO; S. Lu; A. Chen,; J. Chen; R. Guo; RUEY-SHAN GUO

Showing items 1-10 of 48 (5 Page(s) Totally)
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