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| 國立交通大學 |
2014-12-08T15:24:12Z |
A New Programming Scheme for the Improvement of Program Disturb Characteristics in Scaled NAND Flash Memory
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Shirota, Riichiro; Huang, Chen-Hao; Nagai, Shinji; Sakamoto, Yoshinori; Li, Fu-Hai; Mitiukhina, Nina; Arakawa, Hideki |
| 國立交通大學 |
2014-12-08T15:21:19Z |
A New Disturb Free Programming Scheme in Scaled NAND Flash Memory
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Shirota, Riichiro; Huang, Chen-Hao; Arakawa, Hideki |
| 國立交通大學 |
2014-12-08T15:20:40Z |
Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of NAND Flash Memory Devices and Floating-Gate Impurity Concentration
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Shirota, Riichiro; Sakamoto, Yoshinori; Hsueh, Hung-Ming; Jaw, Jian-Ming; Chao, Wen-Chuan; Chao, Chih-Ming; Yang, Sheng-Fu; Arakawa, Hideki |
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