| 臺大學術典藏 |
2021-08-05T02:41:47Z |
ASO Author Reflections: Quantitative Shape Analysis of Thyroid Nodules: A Small But Important Step Towards Software-Based Preoperative Evaluation of Thyroid Nodules
|
Wu M.-H;Chen A.; Wu M.-H; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu M.-H;Chen K.-Y;Hsieh M.-S;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Hsieh M.-S; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters
|
Shen Z;Hong A;Chen A.; Shen Z; Hong A; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu M.-H;Chen K.-Y;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Binary multi-layer classifier
|
Zeng H;Chen A.; Zeng H; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:45Z |
Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenoma
|
Kuo T.-C;Wu M.-H;Chen K.-Y;Hsieh M.-S;Chen A;Chen C.-N.; Kuo T.-C; Wu M.-H; Chen K.-Y; Hsieh M.-S; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:45Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
|
Wu M.-H;Chen K.-Y;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-07-15T05:31:39Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
MING-HSUN WU; KUEN-YUAN CHEN; MIN-SHU HSIEH; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-05-21T11:40:28Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-04-21T23:29:56Z |
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters
|
Shen, Zixin; Hong, Amos; ARGON CHEN |
| 臺大學術典藏 |
2021-02-04T02:30:12Z |
Computerized cytological features for papillary thyroid cancer diagnosis—preliminary report
|
Shih, S.-R.;Jan, I.-S.;Chen, K.-Y.;Chuang, W.-Y.;Wang, C.-Y.;Hsiao, Y.-L.;Chang, T.-C.;Chen, A.; Shih, S.-R.; Jan, I.-S.; Chen, K.-Y.; Chuang, W.-Y.; Wang, C.-Y.; Hsiao, Y.-L.; Chang, T.-C.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2021-01-18T09:12:08Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
|
MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Run-To-run control of CMP process considering aging effects of pad and disc
|
Chen, A.; Guo, R.-S.; Chou, Y.L.; Lin, C.L.; Dun, J.; Wu, S.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
A real-time equipment monitoring and fault detection system
|
Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S.; Huang, S.J.; Lee, Y.C.; Chang, S.G.; Lee, M.Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
An economic design of x control chart using quadratic loss function
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Optimal levels of process parameters for products with multiple characteristics
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Applications of quantitative methods in semiconductor manufacturing
|
Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
|
Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Age-based double EWMA controller and its application to a CMP process
|
Chen, A.; Guo, R.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Recipe-independent tool health indicator and fault prognosis
|
Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
|
Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN |
