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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"argon chen"的相關文件
顯示項目 1-10 / 66 (共7頁)
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| 臺大學術典藏 |
2022-09-21T23:30:43Z |
Assessing Detection Accuracy of Computerized Sonographic Features and Computer-Assisted Reading Performance in Differentiating Thyroid Cancers
|
HAO-CHIH TAI; KUEN-YUAN CHEN; MING-HSUN WU; Chang, King Jen; CHIUNG-NIEN CHEN; ARGON CHEN |
| 臺大學術典藏 |
2022-09-21T23:30:43Z |
Multivariate multi-layer classifier
|
Zeng, Huanze; ARGON CHEN |
| 臺大學術典藏 |
2022-04-14T06:00:55Z |
Computerized quantification of ultrasonic heterogeneity in thyroid nodules
|
Chen, Kuen-Yuan; Chen, Chiung-Nien; Wu, Ming-Hsun; Ho, Ming-Chih; Tai, Hao-Chih; WEN-HUNG KUO; Huang, Wen-Chang; Wang, Yu-Hsin; ARGON CHEN; Chang, King-Jen |
| 臺大學術典藏 |
2021-11-26T02:42:29Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu, Ming-Hsun; KUEN-YUAN CHEN; Hsieh, Min-Shu; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-26T02:37:07Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu, Ming-Hsun; KUEN-YUAN CHEN; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-23T05:32:57Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu, Ming-Hsun; Chen, Kuen-Yuan; Hsieh, Min-Shu; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-11-23T05:12:52Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu, Ming-Hsun; Chen, Kuen-Yuan; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-11-18T07:58:39Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
MING-HSUN WU; Chen, Kuen-Yuan; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-18T07:48:29Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
MING-HSUN WU; Chen, Kuen-Yuan; Hsieh, Min-Shu; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-08-05T02:41:47Z |
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing
|
Rostami H;Blue J;Chen A;Yugma C.; Rostami H; Blue J; Chen A; Yugma C.; ARGON CHEN |
顯示項目 1-10 / 66 (共7頁)
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