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"argon chen"的相關文件
顯示項目 56-65 / 66 (共7頁)
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| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Applications of quantitative methods in semiconductor manufacturing
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M?nch, L.; Chen, A.; Ham, A.; Morrison, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:54Z |
Computerized Quantification of Ultrasonic Heterogeneity in Thyroid Nodules
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Chen, K.-Y.; Chen, C.-N.; Wu, M.-H.; Ho, M.-C.; Tai, H.-C.; Kuo, W.-H.; Huang, W.-C.; Wang, Y.-H.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:53Z |
Manufacturing Parameters Optimization in Functional Textile Dyeing Processes
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Hong, I.-H.; Shen, Z.; Chen, S.-C.; Chen, A.; Tsai, K.-C.; Lin, Y.-T.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:53Z |
Quantitative analysis of echogenicity for patients with thyroid nodules
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Chen, C.-N.; Chen, K.-Y.; Ho, M.-C.; Tai, H.-C.; Wang, Y.-H.; Chen, A.; Chang, K.-J.; ARGON CHEN; Wu, M.-H. |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
A Variance-reduction Approach to Detection of the Thyroid-nodule Boundary on Ultrasound Images
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Chiu, L.-Y.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenoma
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ARGON CHEN;Chen, C.-N.;Chen, A.;Hsieh, M.-S.;Chen, K.-Y.;Wu, M.-H.;Kuo, T.-C.; Kuo, T.-C.; Wu, M.-H.; Chen, K.-Y.; Hsieh, M.-S.; Chen, A.; Chen, C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:52Z |
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing
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Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; ARGON CHEN |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
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David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2013 |
Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodules
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Wu, M.-H.; Chen, C.-N.; Chen, K.-Y.; Ho, M.-C.; Tai, H.-C.; Chung, Y.-C.; Lo, C.-P.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 元智大學 |
2007-06 |
Design of Optimization-Tool Benchmark System for Continuous Improvements of Semiconductor Manufacturing
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范治民; Jakey Lan; Shi-Chung Chang; Da-Yin Liao; Argon Chen; Yon-Chun Chou |
顯示項目 56-65 / 66 (共7頁)
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