| 臺大學術典藏 |
2022-09-21T23:30:43Z |
Assessing Detection Accuracy of Computerized Sonographic Features and Computer-Assisted Reading Performance in Differentiating Thyroid Cancers
|
HAO-CHIH TAI; KUEN-YUAN CHEN; MING-HSUN WU; Chang, King Jen; CHIUNG-NIEN CHEN; ARGON CHEN |
| 臺大學術典藏 |
2022-09-21T23:30:43Z |
Multivariate multi-layer classifier
|
Zeng, Huanze; ARGON CHEN |
| 臺大學術典藏 |
2022-04-14T06:00:55Z |
Computerized quantification of ultrasonic heterogeneity in thyroid nodules
|
Chen, Kuen-Yuan; Chen, Chiung-Nien; Wu, Ming-Hsun; Ho, Ming-Chih; Tai, Hao-Chih; WEN-HUNG KUO; Huang, Wen-Chang; Wang, Yu-Hsin; ARGON CHEN; Chang, King-Jen |
| 臺大學術典藏 |
2021-11-26T02:42:29Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu, Ming-Hsun; KUEN-YUAN CHEN; Hsieh, Min-Shu; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-26T02:37:07Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu, Ming-Hsun; KUEN-YUAN CHEN; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-23T05:32:57Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu, Ming-Hsun; Chen, Kuen-Yuan; Hsieh, Min-Shu; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-11-23T05:12:52Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu, Ming-Hsun; Chen, Kuen-Yuan; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-11-18T07:58:39Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
MING-HSUN WU; Chen, Kuen-Yuan; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-11-18T07:48:29Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
MING-HSUN WU; Chen, Kuen-Yuan; Hsieh, Min-Shu; ARGON CHEN; Chen, Chiung-Nien |
| 臺大學術典藏 |
2021-08-05T02:41:47Z |
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing
|
Rostami H;Blue J;Chen A;Yugma C.; Rostami H; Blue J; Chen A; Yugma C.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:47Z |
ASO Author Reflections: Quantitative Shape Analysis of Thyroid Nodules: A Small But Important Step Towards Software-Based Preoperative Evaluation of Thyroid Nodules
|
Wu M.-H;Chen A.; Wu M.-H; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
Wu M.-H;Chen K.-Y;Hsieh M.-S;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Hsieh M.-S; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters
|
Shen Z;Hong A;Chen A.; Shen Z; Hong A; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
Wu M.-H;Chen K.-Y;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:46Z |
Binary multi-layer classifier
|
Zeng H;Chen A.; Zeng H; Chen A.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:45Z |
Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenoma
|
Kuo T.-C;Wu M.-H;Chen K.-Y;Hsieh M.-S;Chen A;Chen C.-N.; Kuo T.-C; Wu M.-H; Chen K.-Y; Hsieh M.-S; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-08-05T02:41:45Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
|
Wu M.-H;Chen K.-Y;Chen A;Chen C.-N.; Wu M.-H; Chen K.-Y; Chen A; Chen C.-N.; ARGON CHEN |
| 臺大學術典藏 |
2021-07-15T05:31:39Z |
Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns
|
MING-HSUN WU; KUEN-YUAN CHEN; MIN-SHU HSIEH; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-05-21T11:40:28Z |
Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation
|
MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2021-04-21T23:29:56Z |
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters
|
Shen, Zixin; Hong, Amos; ARGON CHEN |
| 臺大學術典藏 |
2021-02-04T02:30:12Z |
Computerized cytological features for papillary thyroid cancer diagnosis—preliminary report
|
Shih, S.-R.;Jan, I.-S.;Chen, K.-Y.;Chuang, W.-Y.;Wang, C.-Y.;Hsiao, Y.-L.;Chang, T.-C.;Chen, A.; Shih, S.-R.; Jan, I.-S.; Chen, K.-Y.; Chuang, W.-Y.; Wang, C.-Y.; Hsiao, Y.-L.; Chang, T.-C.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2021-01-18T09:12:08Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
|
MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Run-To-run control of CMP process considering aging effects of pad and disc
|
Chen, A.; Guo, R.-S.; Chou, Y.L.; Lin, C.L.; Dun, J.; Wu, S.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
A real-time equipment monitoring and fault detection system
|
Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S.; Huang, S.J.; Lee, Y.C.; Chang, S.G.; Lee, M.Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
An economic design of x control chart using quadratic loss function
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Optimal levels of process parameters for products with multiple characteristics
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Applications of quantitative methods in semiconductor manufacturing
|
Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
|
Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Age-based double EWMA controller and its application to a CMP process
|
Chen, A.; Guo, R.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Recipe-independent tool health indicator and fault prognosis
|
Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
|
Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Sample Efficient Regression Trees (SERT) for yield loss analysis
|
Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Design and performance analysis ofthe exponentially weighted moving average mean estimate for processes subject to random step changes
|
Chen, A.; Elsayed, E.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
|
Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; Wei, C.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Priority behavior modeling of fab for supply chain management
|
Chang, S.-C.; Liao, B.-J.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Recipe-independent indicator for tool health diagnosis and predictive maintenance
|
Chen, A.; Blue, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal sampling in design of experiment for simulation-based stochastic optimization
|
Brantley, M.W.; Lee, L.H.; Chen, C.-H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Statistical multi-objective optimization and its application to IC layout design for E-tests
|
Chen, A.; Chen, V.; Hsu, C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal supply chain configurations in semiconductor manufacturing
|
Chiang, D.; Guo, R.-S.; Chen, A.; Cheng, M.-T.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Priority cycle time behavior modeling for semiconductor fabs
|
Chang, S.-C.; Liao, B.-J.; Kao, Y.-T.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Rare-event splitting simulation for analysis of power system blackouts
|
Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Computerized Detection and Quantification of Microcalcifications in Thyroid Nodules
|
Chen, K.-Y.; Chen, C.-N.; Wu, M.-H.; Ho, M.-C.; Tai, H.-C.; Huang, W.-C.; Chung, Y.-C.; Chen, A.; Chang, K.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
The conservation network of horseshoe crab Tachypleus tridentatus in Taiwan
|
Chen, C.-P.; Hsieh, H.-L.; Chen, A.; Yeh, H.-Y.; Lin, P.-F.; Wang, W.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Optimum sampling for track PEB CD integrated metrology
|
Chen, A.; Hsueh, S.; Blue, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Efficient simulation budget allocation with regression
|
Brantley, M.W.; Lee, L.H.; Chen, C.-H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis
|
Hong, A.; Chen, A.; ARGON CHEN |
