| 臺大學術典藏 |
2021-02-04T02:30:12Z |
Computerized cytological features for papillary thyroid cancer diagnosis—preliminary report
|
Shih, S.-R.;Jan, I.-S.;Chen, K.-Y.;Chuang, W.-Y.;Wang, C.-Y.;Hsiao, Y.-L.;Chang, T.-C.;Chen, A.; Shih, S.-R.; Jan, I.-S.; Chen, K.-Y.; Chuang, W.-Y.; Wang, C.-Y.; Hsiao, Y.-L.; Chang, T.-C.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2021-01-18T09:12:08Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
|
MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Run-To-run control of CMP process considering aging effects of pad and disc
|
Chen, A.; Guo, R.-S.; Chou, Y.L.; Lin, C.L.; Dun, J.; Wu, S.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
A real-time equipment monitoring and fault detection system
|
Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S.; Huang, S.J.; Lee, Y.C.; Chang, S.G.; Lee, M.Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
An economic design of x control chart using quadratic loss function
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Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Optimal levels of process parameters for products with multiple characteristics
|
Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Applications of quantitative methods in semiconductor manufacturing
|
Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
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Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Age-based double EWMA controller and its application to a CMP process
|
Chen, A.; Guo, R.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Recipe-independent tool health indicator and fault prognosis
|
Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
|
Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Sample Efficient Regression Trees (SERT) for yield loss analysis
|
Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Design and performance analysis ofthe exponentially weighted moving average mean estimate for processes subject to random step changes
|
Chen, A.; Elsayed, E.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
|
Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; Wei, C.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Priority behavior modeling of fab for supply chain management
|
Chang, S.-C.; Liao, B.-J.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Recipe-independent indicator for tool health diagnosis and predictive maintenance
|
Chen, A.; Blue, J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal sampling in design of experiment for simulation-based stochastic optimization
|
Brantley, M.W.; Lee, L.H.; Chen, C.-H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Statistical multi-objective optimization and its application to IC layout design for E-tests
|
Chen, A.; Chen, V.; Hsu, C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:57Z |
Optimal supply chain configurations in semiconductor manufacturing
|
Chiang, D.; Guo, R.-S.; Chen, A.; Cheng, M.-T.; Chen, C.-B.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Priority cycle time behavior modeling for semiconductor fabs
|
Chang, S.-C.; Liao, B.-J.; Kao, Y.-T.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:56Z |
Rare-event splitting simulation for analysis of power system blackouts
|
Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; ARGON CHEN |
