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Showing items 21-30 of 66 (7 Page(s) Totally)
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| 臺大學術典藏 |
2021-02-04T02:30:12Z |
Computerized cytological features for papillary thyroid cancer diagnosis—preliminary report
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Shih, S.-R.;Jan, I.-S.;Chen, K.-Y.;Chuang, W.-Y.;Wang, C.-Y.;Hsiao, Y.-L.;Chang, T.-C.;Chen, A.; Shih, S.-R.; Jan, I.-S.; Chen, K.-Y.; Chuang, W.-Y.; Wang, C.-Y.; Hsiao, Y.-L.; Chang, T.-C.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2021-01-18T09:12:08Z |
Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules
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MING-HSUN WU; KUEN-YUAN CHEN; ARGON CHEN; CHIUNG-NIEN CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Run-To-run control of CMP process considering aging effects of pad and disc
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Chen, A.; Guo, R.-S.; Chou, Y.L.; Lin, C.L.; Dun, J.; Wu, S.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
A real-time equipment monitoring and fault detection system
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Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S.; Huang, S.J.; Lee, Y.C.; Chang, S.G.; Lee, M.Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
An economic design of x control chart using quadratic loss function
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Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Optimal levels of process parameters for products with multiple characteristics
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Elsayed, E.A.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Applications of quantitative methods in semiconductor manufacturing
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Moench, Lars; Chen, Argon; Ham, Andy; Morrison, James; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
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Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
Showing items 21-30 of 66 (7 Page(s) Totally)
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