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Institution Date Title Author
臺大學術典藏 2018-09-10T06:35:26Z Real-time spatial control of photoresist development rate Arthur Tay; Weng-Khuen Ho; Ni Hu; Choon-Meng Kiew; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z A fast in situ approach to estimating wafer warpage profile during thermal processing in microlithography Ni Hu; Arthur Tay; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Real-time spatial control of steady-state wafer temperature during thermal processing in microlithography Arthur Tay; Weng-Khuen Ho; Ni Hu; Kuen-Yu Tsai; Ying Zhou; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Feedback control of piezo-based nanopositioning systems for semiconductor manufacturing Kuen-Yu Tsai; Jia-Yush Yen; Arthur Tay; Jyh-Fa Lee; KUEN-YU TSAI; Yea-Chin Yeh; Chun-Hung Liu
臺大學術典藏 2018-09-10T05:27:09Z In-situ fault detection of wafer warpage in lithography Arthur Tay; Weng Khuen Ho; Christopher Yap; Chen Wei; Kuen-Yu Tsai; KUEN-YU TSAI

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