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机构 日期 题名 作者
國立成功大學 2004-01-30 Monitor and eliminate the circular defects in HDP-STI deposition through oxynitride/oxide composite liner Lan, Jin-Kun; Wang, Ying-Lang; Liu, Chuan-Pu; Lee, Wen-His; Ay, Chyung; Cheng, Yi-Lung; Chang, Shih-Chieh
國立成功大學 2004-01-30 Study on precipitations of fluorine-doped silicon oxide Wu, Jun; Wang, Ying-Lang; Liu, Chuan-Pu; Chang, Shih-Chieh; Kuo, Cheng-Tzu; Ay, Chyung
國立成功大學 2004-01-30 Moisture resistance and thermal stability of fluorine-incorporation siloxane-based low-dielectric-constant material Cheng, Y. L.; Wang, Y. L.; Wu, Y. L.; Liu, Chuan-Pu; Liu, C. W.; Lan, J. K.; O'Neil, M. L.; Ay, Chyung; Feng, M. S.
國立成功大學 2003-11-15 The application of electrochemical metrologies for investigating chemical mechanical polishing of Al with a Ti barrier layer Chiu, Shao-Yu; Wang, Ying-Lang; Liu, Chuan-Pu; Lan, Jin-Kun; Ay, Chyung; Feng, Ming-Shiann; Tsai, Ming-Shih; Dai, Bau-Tong
國立成功大學 2003-09 Mechanisms of circular defects for shallow trench isolation oxide deposition Lan, Jin-Kun; Wang, Ying-Lang; Liu, Chuan-Pu; Chao, Chuen-Guang; Ay, Chyung; Liu, Chi-Wen; Cheng, Yi-Lung
國立成功大學 2003-01-15 Integration of a stack of two fluorine doped silicon oxide film with ULSI interconnect metallization Cheng, Y. L.; Wang, Y. L.; Liu, Chuan-Pu; Wu, Y. L.; Lo, K. Y.; Liu, C. W.; Lan, J. K.; Ay, Chyung; Feng, M. S.

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