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Institution Date Title Author
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:31Z Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs B. C. Bai;J. C. M. Li; B. C. Bai; J. C. M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:31Z Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs B. C. Bai;J. C. M. Li; B. C. Bai; J. C. M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T07:43:08Z Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI
臺大學術典藏 2018-09-10T07:43:08Z Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI
臺大學術典藏 2018-09-10T07:43:07Z Power Scan: DFT for Power Switches in VLSI Designs B. C. Bai; B. C. Bai; CHIEN-MO LI
臺大學術典藏 2018-09-10T07:43:07Z Power Scan: DFT for Power Switches in VLSI Designs B. C. Bai; B. C. Bai; CHIEN-MO LI

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