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| 淡江大學 |
2007-01-22 |
Comparison of electronic structures of RuO2 and IrO2 nanorods investigated by x-ray absorption and scanning photoelectron microscopy
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Tsai, H. M.; Babu, P. D.; Pao, C. W.; Chiou, J. W.; Jan, J. C.; Krishna Kumar, K. P.; 錢凡之; Chien, F. Z.; 彭維鋒; Pong, Way-faung; Tsai, M. H.; Chen, Chih-Hao; Jang, L. Y.; Lee, J. F.; Chen, R. S.; Huang, Y. S.; Tsai, D. S. |
| 淡江大學 |
2006-05-01 |
Electeonic structures of group-III-nitride nanorods studied by x-ray absorption, x-ray emission, and Raman spectroscopy
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Pao, C. W.; Babu, P. D.; Tsai, H. M.; Chiou, J. W.; Ray, S. C.; Yang, S. C.; Chien, F. Z.; Pong, W. F.; Tsai, M.-H.; Hsu, C. W.; Chen, L. C.; Chen, C. C.; Chen, K. H.; Lin, H.-J.; Lee, J. F.; Guo, J. H. |
| 淡江大學 |
2006-05 |
Electronic structures of group-III–nitride nanorods studied by x-ray absorption, x-ray emission, and Raman spectroscopy
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Pao, C. W.; Babu, P. D.; Tsai, H. M.; Chiou, J. W.; Ray, S. C.; Yang, S. C.; Chien, F. Z.; Pong, W. F.; Tsai, M.-H. ; Hsu, C. W. ; Chen, L. C.; Chen, C. C.; Chen, K. H.; Lin, H.-J.; Lee, J. F.; Guo, J. H. |
| 淡江大學 |
2005-04-18 |
Bonding properties and their relation to residual stress and refractive index of amorphous Ta(N,O) films investigated by x-ray absorption spectroscopy
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Jan, J. C.; Babu, P. D.; Tsai, H. M.; Pao, C. W.; Chiou, J. W.; Ray, S. C.; Krishna Kumar, K. P.; 彭維鋒; Pong, W. F.; Tsai, M. H.; Jong, C. A.; Chin, T. S. |
| 淡江大學 |
2005-04 |
Bonding properties and their relation to residual stress and refractive index of amorphous Ta(N,O) films investigated by x-ray absorption spectroscopy
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Jan, J. C.; Babu, P. D.; Tsai, H. M.; Pao, C. W.; Chiou, J. W.; Ray, S. C.; Krishna Kumar, K. P.; Pong, W. F.; Tsai, M.-H.; Jong, C. A.; Chin, T. S. |
Showing items 1-5 of 5 (1 Page(s) Totally)
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