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Institution Date Title Author
國立臺灣大學 2012 Improved Resistive Switching Memory Characteristics Using Core-Shell IrOx Nano-Dots in Al2O3/WOx Bilayer Structure Banerjee, W.; Maikap, S.; Rahaman, S.Z.; Prakash, A.; Tien, T.-C.; Li, W.-C.; Yang, J.-R.
國立臺灣大學 2011 Impact of metal nano layer thickness on tunneling oxide and memory performance of core-shell iridium-oxide nanocrystals Banerjee, W.; Maikap, S.; Tien, T.-C.; Li, W.-C.; Yang, J.-R.
國立臺灣大學 2011 Temperature-Dependent Physical and Memory Characteristics of Atomic-Layer-Deposited RuOx Metal Nanocrystal Capacitors Maikap, S.; Banerjee, W.; Tien, T.C.; Wang, T.Y.; Yang, J.R.

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