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Institution	Date	Title	Author
國立成功大學	2003-05-26	Deep level defect in Si-implanted GaN n(+)-p junction	Chen, X. D.; Huang, Y.; Fung, S.; Beling, C. D.; Ling, C. C.; Sheu, Jinn-Kong; Lee, M. L.; Chi, Gou-Chung; Chang, Shoou-Jinn

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