臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 46-54 of 54 (3 Page(s) Totally)
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Institution	Date	Title	Author
南台科技大學	1996	SIMS Linescan Profiling of Chemically Bevelled Semiconductors : A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling	許進明; C.M. Hsu; D.S. McPhail
南台科技大學	1995	A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis	許進明; C. M. Hsu; D. S. McPhail
南台科技大學	1995	SIMS analysis of Al -doped GaAs test structures using chemical bevelling as a sample preparation technique	許進明; C.M. Hsu; V.K.M. Sharma; M.J. Ashwin; D.S. McPhail
南台科技大學	1995	Newly Developed Chemical Bevelling Technique Used for SIMS Analysis of GaAs based semiconductor structures	許進明; C. M. Hsu; D. S. McPhai
南台科技大學	1994	A method of improving the SIMS analysis of Si in GaAs by monitoring SiO2− ions at oblique angles of bombardment	許進明; V.K.M. Skarma; D.S. McPhail; C.M. Hsu; M.R. Fahy
南台科技大學	1993	The Application of AAS in MBE System as a Monolayer Monitor	許進明; C.M. Hsu
南台科技大學	1992	S-Gun 濺鍍系統之原理及應用	許進明; C.M. Hsu
國立中山大學	1991	Effects of Cultivation Conditions on the Cytochrome Oxidase Activities in Bacillus Thuringiensis Subsp, Israelensis HD-567	J.K. Liu;C.H. Hsu;D. Chao;C.M. Hsu
南台科技大學	1989	Low pressure chemical vapor deposition of Aluminum Nitride thin film	許進明; C.H. Lee;C.M. Hsu

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