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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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2019臺灣學術機構典藏
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Institution Date Title Author
國立東華大學 2002 Field emission and Raman spectroscopy studies of atomic hydrogen etching on boron and nitrogen doped diamond films Wu Y. H. ; C. M. Hsu ; C. T. Chia ; I. N. Lin ; C. L. Cheng
國立東華大學 2002 Preparation and Properties of BN/AlN Nanolaminates Lee C.H. ; T. S. Yang ; C. M. Hsu ; C. L. Chenga ; M. S. Wong
國立東華大學 2001 Field emission and Raman spectroscopy studies of atomic hydrogen etching on boron and nitrogen doped DLC films Wu Y. H. ; C. M. Hsu ; C. T. Chia ; I. N. Lin ; C. L. Cheng
國立政治大學 2000-01 Interactively Directing Virtual Crowds in a Virtual Environment 李蔡彥;J.W. Lin;Y.L. Liu;C.M. Hsu
南台科技大學 1998 The Trend of TFT_LCD Process System 許進明; C.M. Hsu
南台科技大學 1996 SIMS Linescan Profiling of Chemically Bevelled Semiconductors : A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling 許進明; C.M. Hsu; D.S. McPhail
南台科技大學 1995 A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis 許進明; C. M. Hsu; D. S. McPhail
南台科技大學 1995 SIMS analysis of Al -doped GaAs test structures using chemical bevelling as a sample preparation technique 許進明; C.M. Hsu; V.K.M. Sharma; M.J. Ashwin; D.S. McPhail
南台科技大學 1995 Newly Developed Chemical Bevelling Technique Used for SIMS Analysis of GaAs based semiconductor structures 許進明; C. M. Hsu; D. S. McPhai
南台科技大學 1994 A method of improving the SIMS analysis of Si in GaAs by monitoring SiO2− ions at oblique angles of bombardment 許進明; V.K.M. Skarma; D.S. McPhail; C.M. Hsu; M.R. Fahy
南台科技大學 1993 The Application of AAS in MBE System as a Monolayer Monitor 許進明; C.M. Hsu
南台科技大學 1992 S-Gun 濺鍍系統之原理及應用 許進明; C.M. Hsu
國立中山大學 1991 Effects of Cultivation Conditions on the Cytochrome Oxidase Activities in Bacillus Thuringiensis Subsp, Israelensis HD-567 J.K. Liu;C.H. Hsu;D. Chao;C.M. Hsu
南台科技大學 1989 Low pressure chemical vapor deposition of Aluminum Nitride thin film 許進明; C.H. Lee;C.M. Hsu

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