臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 1-10 of 26 (3 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2019-10-31T06:49:32Z	Global Expression Profiling Identifies a Novel Hyaluronan Synthases 2 Gene in the Pathogenesis of Lower Extremity Varicose Veins	ERIC YAO-YU CHUANG;I.H. Wu;E.Y. Chuang;J.J. Hwang;S.N. Chang;Y.H. Chen;C.T. Tsai;C.S. Hsieh; C.S. Hsieh; C.T. Tsai; Y.H. Chen; S.N. Chang; J.J. Hwang; E.Y. Chuang; I.H. Wu; ERIC YAO-YU CHUANG
臺大學術典藏	2019-10-31T06:49:32Z	Genome-Wide Copy Number Variation Association Study of Atrial Fibrillation Related Thromboembolic Stroke	ERIC YAO-YU CHUANG;C.T. Tsai;E.Y. Chuang;J.J. Hwang;C.K. Wu;S.N. Chang;P.S. Huang;C.S. Hsieh; C.S. Hsieh; P.S. Huang; S.N. Chang; C.K. Wu; J.J. Hwang; E.Y. Chuang; C.T. Tsai; ERIC YAO-YU CHUANG
臺大學術典藏	2018-09-10T18:03:13Z	Colorless WRC-FPLDs Subject to Gain-Saturated RSOA Feedback for WDM-PONs	M. L. Deng;R. P. Giddings;C.-T. Tsai;G.-R. Lin;J. M. Tang; M. L. Deng; R. P. Giddings; C.-T. Tsai; G.-R. Lin; J. M. Tang; GONG-RU LIN
臺大學術典藏	2018-09-10T08:18:05Z	Shallow trench isolation-related narrow channel effect on the kink behaviour of 40 nm PD SOI NMOS device	H. J. Hung;J. B. kuo;D. Chen;C. T. Tsai;C. S. Yeh; H. J. Hung; J. B. kuo; D. Chen; C. T. Tsai; C. S. Yeh; JAMES-B KUO
臺大學術典藏	2018-09-10T07:41:38Z	Floating-Body-Effect-Related Gate Tunneling Leakage Current Phenomenon of 40nm PD SOI NMOS Device	H. J. Hung;J. B. Kuo;C. T. Tsai;D. Chen; H. J. Hung; J. B. Kuo; C. T. Tsai; D. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T07:41:37Z	Shallow Trench Isolated-Related Narrow Channel Effect on Kink Effect and Breakdown Behavior of 40nm PD SOI NMOS Device	J. I. Lu;H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai; J. I. Lu; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; JAMES-B KUO
臺大學術典藏	2018-09-10T07:08:19Z	STI Mechanical-Stress Induced Small-Geometry Effect on Hysteresis Phenomenon of 40nm PD SOI NMOS Device	H. J. Hung;J. I. Lu;J. B. Kuo;G. S. Lin;C. S. Yeh;C. T. Tsai;M. Ma; H. J. Hung; J. I. Lu; J. B. Kuo; G. S. Lin; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO
臺大學術典藏	2018-09-10T07:08:18Z	Breakdown Behavior of 40-nm PD-SOI NMOS Device Considering STI-Induced Mechanical Stress Effect	I. S. Lin;V. C. Su;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai;M. Ma; I. S. Lin; V. C. Su; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO
臺大學術典藏	2018-09-10T07:08:18Z	Shallow-trench-isolation (STI)-induced mechanical-stress-related kink-effect behaviors of 40-nm PD SOI NMOS device	I. S. Lin;V. C. Su;J. B. Kuo;R. Lee;G. S. Lin;D. Chen;C. S. Yeh;C. T. Tsai;M. Ma; I. S. Lin; V. C. Su; J. B. Kuo; R. Lee; G. S. Lin; D. Chen; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO
臺大學術典藏	2018-09-10T07:08:18Z	STI-Induced Mechanical-Stress-Related Kink Effect of 40nm PD SOI NMOS Devices	I. S. Lin; V. C. Su; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO

Showing items 1-10 of 26 (3 Page(s) Totally)
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