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Showing items 1-3 of 3 (1 Page(s) Totally)
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| 國立彰化師範大學 |
2006-09 |
The Magnetoresistance Ratio of an MTJ Device and the Influence of Ramping DC Bias Voltage Rate Measured by Conducting Atomic Force Microscope
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Shu, Min-Fong; Canizo-Cabrera, A. ; Hsu, Chih-Cheng; Chen, C. C. ; Wu, Jong-Ching; Yang, Chao-Chen; Wu, Te-Ho |
| 國立彰化師範大學 |
2006 |
Tunneling Magnetoresistance of Magnetic Tunneling Junction Cell Measured by Conducting Atomic Force Microscopy with Ramping Dc Bias Voltage Rate
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Shu, Min-Fong; Canizo-Cabrera, A. ; Hsu, Chih-Cheng; Chen, C. C. ; Wu, Jong-Ching; Li, Simon C. ; Yang, Chao-Chen; Wu, Te-Ho |
| 國立彰化師範大學 |
2005-02 |
Local Current Distribution and Electrical Properties of a Magnetic Tunnel Junction Using Conducting Atomic Force Microscopy
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Canizo-Cabrera, A. ; Li, Simon C. ; Shu, Min-Fong; Lee, Jia-Mou; Garcia-Vazquez, Valentin. ; Chen, C. C. ; Wu, Jong-Ching; Takahashi, M. ; Wu, Te-Ho |
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