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| 國立臺灣大學 |
1993 |
Ab Initio Calculation of Band Structure, X-ray Emission, Quantum Yield and Electron-Energy-Loss Spectra of Hexagonal Boron Nitride
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Ma, H.; 林聖賢; Carpenter, R. W.; Rice, P.; Sankey, O. F.; Ma, H.; Lin, Sheng-Hsien; Carpenter, R. W.; Rice, P.; Sankey, O. F. |
| 國立臺灣大學 |
1991 |
Ab Initio Study of the Valence-electron Relaxation Effect on X-ray Emission Spectra and the Excitionic Effect on Electron-energy-loss Spectra of the SiL2,3 Edge
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Ma, H.; 林聖賢; Carpenter, R. W.; Sankey, O. F.; Ma, H.; Lin, Sheng-Hsien; Carpenter, R. W.; Sankey, O. F. |
| 國立臺灣大學 |
1990 |
Study of the Interfacial Concentratin Profile of Two Component Systems in the Solid-Solid Interface
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Tapia, N.; Ma, H.; 林聖賢; Carpenter, R. W.; Tapia, N.; Ma, H.; Lin, Sheng-Hsien; Carpenter, R. W. |
| 國立臺灣大學 |
1990 |
Theoretical Comparison of Electron Energy-Loss and X-ray Absorption Near-Edge Fine Structure of SiL2,3 Edge
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Ma, H.; 林聖賢; Carpenter, R. W.; Sankey, O. F.; Ma, H.; Lin, Sheng-Hsien; Carpenter, R. W.; Sankey, O. F. |
| 國立臺灣大學 |
1988 |
Analysis of Valence Shell Electronic Excitations in Si and Its Refractory Compounds Using Electron Energy Loss Microspectroscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1988 |
K,L,M,N,O and P Ionization Cross Sections for Electron Energy Loss Spectroscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1987 |
Near-edge Fine Structure Analysis of Core Shell Electronic Absorption Edges in Si and Its Refractory Compounds Using Electron Energy Loss Microscopy
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
| 國立臺灣大學 |
1985 |
SiL Core Edge Fine Structure in an Oxidation Series of Silicon Compounds:a Comparison of Micro Electron Energy Loss Spectra with Theory
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Skiff, W. M.; Carpenter, R. W.; 林聖賢; Skiff, W. M.; Carpenter, R. W.; Lin, Sheng-Hsien |
Showing items 1-8 of 8 (1 Page(s) Totally)
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