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| 臺大學術典藏 |
2018-09-10T08:14:17Z |
Metal-gate/high-κ CMOS scaling from Si to Ge at small EOT
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Chen, W.B.; Shie, B.S.; Hsu, K.C.; Chen, P.C.; Cheng, C.H.; Chi, C.C.; Wu, Y.H.; Chaing-Liaoc, K.S.; Wang, S.J.; Kuan, C.H.; Yeh, F.S.; Chin, A.; CHIEH-HSIUNG KUANet al. |
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