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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 臺大學術典藏 |
2021-08-05T02:37:34Z |
Ferroelectric HfZrO2with Electrode Engineering and Stimulation Schemes as Symmetric Analog Synaptic Weight Element for Deep Neural Network Training
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Hsiang K.-Y;Liao C.-Y;Chen K.-T;Lin Y.-Y;Chueh C.-Y;Chang C;Tseng Y.-J;Yang Y.-J;Chang S.T;Liao M.-H;Hou T.-H;Wu C.-H;Ho C.-C;Chiu J.-P;Chang C.-S;Lee M.H.; Hsiang K.-Y; MING-HAN LIAO et al. |
| 臺大學術典藏 |
2019-07-15T04:24:44Z |
Dual mode fiber optic SPR chemical microsensor
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Lin C.-W.;Liou Y.-T.;Huang C.-Y.;Chiu J.-P.;Kou T.-S.; Lin C.-W.; Liou Y.-T.; Huang C.-Y.; Chiu J.-P.; Kou T.-S. |
| 國立交通大學 |
2014-12-08T15:39:27Z |
Use of Random Telegraph Signal as Internal Probe to Study Program/Erase Charge Lateral Spread in a SONOS Flash Memory
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Chou, Y. L.; Chiu, J. P.; Ma, H. C.; Wang, Tahui; Chao, Y. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:21:24Z |
A Comparative Study of NBTI and RTN Amplitude Distributions in High-kappa Gate Dielectric pMOSFETs
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Chiu, J. P.; Chung, Y. T.; Wang, Tahui; Chen, Min-Cheng; Lu, C. Y.; Yu, K. F. |
| 國立交通大學 |
2014-12-08T15:21:22Z |
Investigation of Post-NBT Stress Current Instability Modes in HfSiON Gate Dielectric pMOSFETs by Measurement of Individual Trapped Charge Emissions
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Ma, H. C.; Chiu, J. P.; Tang, C. J.; Wang, Tahui; Chang, C. S. |
| 國立交通大學 |
2014-12-08T15:21:21Z |
Program Charge Effect on Random Telegraph Noise Amplitude and Its Device Structural Dependence in SONOS Flash Memory
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Chiu, J. P.; Chou, Y. L.; Ma, H. C.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:08:23Z |
Program Trapped-Charge Effect on Random Telegraph-Noise Amplitude in a Planar SONOS Flash Memory Cell
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Ma, H. C.; Chou, Y. L.; Chiu, J. P.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
Showing items 1-7 of 7 (1 Page(s) Totally)
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