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中國文化大學 |
2017-09 |
An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm
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Chiang, YC (Chiang, Yuan-Ching); Chiu, JT (Chiu, Jinn-Tong); Chang, ZJ (Chang, Zhi-Jie); Chang, DY (Chang, Dar-Yuan) |
中國文化大學 |
2009 |
A new probe design combining finite element method and optimization used for vertical probe card in wafer probing
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Chang, DY (Chang, Dar-Yuan); Chiu, JT (Chiu, Jinn-Tong) |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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