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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:40:16Z |
A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
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Wang, Yueh-Hua; Cho, Ming-Hsiang; Wu, Lin-Kun |
| 國立交通大學 |
2014-12-08T15:33:44Z |
Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique
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Peng, An-Sam; Cho, Ming-Hsiang; Wang, Yueh-Hua; Wang, Meng-Fang; Chen, David; Wu, Lin-Kun |
| 國立交通大學 |
2014-12-08T15:12:44Z |
Miniature RF test structure for on-wafer device testing and in-line process monitoring
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Cho, Ming-Hsiang; Lee, Ryan; Peng, An-Sam; Chen, David; Yeh, Chune-Sin; Wu, Lin-Kun |
| 國立交通大學 |
2014-12-08T15:12:23Z |
A novel electrically tunable RF inductor with ultra-low power consumption
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Cho, Ming-Hsiang; Wu, Lin-Kun |
| 國立交通大學 |
2014-12-08T15:05:40Z |
Scalable short-open-interconnect S-Parameter de-embedding method for on-wafer microwave characterization of silicon MOSFETs
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Cho, Ming-Hsiang; Wang, Yueh-Hua; Wu, Lin-Kun |
Showing items 1-5 of 5 (1 Page(s) Totally)
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