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| 國立成功大學 |
2006 |
Failure mechanism of electromigration in via sidewall for copper dual damascene interconnection
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Hsu, Y. L.; Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, C. Y.; Chou, T. H.; Chang, S. H. |
| 國立成功大學 |
2005-10 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
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Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J. |
| 國立成功大學 |
2005-08 |
Investigation of structure and properties of nanocrystalline silicon on various buffer layers
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Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; CHou, T. H.; Hwang, Sheng-Beng; HWang, Jeen-Shing; Lin, K. I. |
| 國立成功大學 |
2005-04 |
The effect of doping iodine on organic light-emitting diode
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Chen, S. F.; Fang, Yean-Kuen; Hou, S. C.; Lin, C. Y.; Lin, C. S.; Chang, Wen-Rong; CHou, T. H. |
| 國立成功大學 |
2005-03 |
A deep submicrometer CMOS process compatible high-Q air-gap solenoid inductor with laterally laid structure
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Lin, C. S.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. Y.; Hsieh, Ming-Chun; Lai, C. M.; Chou, T. H.; Chen, C. H. |
| 國立臺灣大學 |
1990 |
Separation of Enantiomeric Protected Dipeptides by Chiral High- Performance Liquid Chromatography
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吳世雄; Lin, S. L.; Lai, S. Y.; Chou, T. H.; Wu, Shih-Hsiung; Lin, S. L.; Lai, S. Y.; Chou, T. H. |
Showing items 141-146 of 146 (6 Page(s) Totally)
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