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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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2019臺灣學術機構典藏
研討會
機構典藏系統RC7版本已
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Institution Date Title Author
元智大學 May-20 Transfer2Depth: Dual Attention Network with Transfer Learning for Monocular Depth Estimation 林智揚; Chia-Hung Yeh; Yao-Pao Huang; Chuan-Yu Chang
元智大學 Jan-20 Cognitive learning performance assessment and analysis with CSCL applied on the NetGuru platform and CSPL applied on the TAoD platform for the network Yung-Hui Chen; Wei-Chun Lee; Chun-Hsiung Tseng; Lawrence Y. Deng; Chuan-Yu Chang; Long-He Lee
元智大學 2020/9/28 Limited-Anchor Deep Neural Network for Moving Object Detection 林智揚; Han-Yi Huang; Wei-Yang Lin; Chuan-Yu Chang; Wen-Thong Chang; Yih-Kuen Jan
元智大學 2019-05-20 Deep Learning based Moving Object Detection for Video Surveillance 林智揚; Han-Yi Huang; Wei-Yang Lin; Chien-Cheng Lee; Chuan-Yu Chang
元智大學 2019-05-20 Deep Learning based Moving Object Detection for Video Surveillance 林智揚; Han-Yi Huang; Wei-Yang Lin; Chien-Cheng Lee; Chuan-Yu Chang
國立臺灣海洋大學 2011-11 Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection Chun-Hsi Li; Chuan-Yu Chang; MuDer Jeng
國立臺灣海洋大學 2009-12 Wafer Defect Inspection by Neural Analysis of Region Features Chuan-Yu Chang; Chun-Hsi Li; Yung-Chi Chang; MuDer Jeng
國立臺灣海洋大學 2009-03-31 Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection Chuan-Yu Chang;Chun-Hsi Li;Si-Yan Lin;MuDer Jeng
國立臺灣海洋大學 2008-02-01 Integrated Two Hopfield Neural Networks for Automatic LED Defect Inspection Chuan-Yu Chang;Chuan-Wang Chang;Chuan-Wang Chang;Mu-Der Jeng
國立臺灣海洋大學 2008-01 Learning vector quantization neural networks for LED wafer defect inspection Chuan-Yu Chang; Chin-Huang Chang; Chun-Hsi Li; MuDer Jeng
亞洲大學 2007-12-20 A Novel Superquadric Fitting based on Radial Euclidean Distance for 3D Objects Fitting Wu-Chih Hu;Chuan-Yu Chang
國立臺灣海洋大學 2007-01 An unsupervised neural network approach for automatic semiconductor wafer defect inspection Chuan-Yu Chang;ChunHsi Li;Jia-Wei Chang; MuDer Jeng
國立臺灣海洋大學 2007 Inspection Results of the Learning Vector Quantization Neural Networks Based LED Wafer Defect Inspection System Chuan-Yu Chang;Chin-Huang Chang;Chun-Hsi Li;MuDer Jeng

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