臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| Total items :0
	Visitors : 51971251 Online Users : 774 Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library

Scope

Adv. Search

Login

Administrator

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

About TAIR
	About TAIR

Browse By
	Institution
	Author
	Title
	Date
	Statistics Chart
	Institution Facts
	Trend

News
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

Copyright
	Publisher & Journal Policy
	TAIR Copyright Conference Minutes

Related Links
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"chuan yu chang"

Return to Browse by Author
Sorting by Title	Sort by Date

Showing items 1-13 of 13 (1 Page(s) Totally)
1
View [10|25|50] records per page

Institution	Date	Title	Author
元智大學	May-20	Transfer2Depth: Dual Attention Network with Transfer Learning for Monocular Depth Estimation	林智揚; Chia-Hung Yeh; Yao-Pao Huang; Chuan-Yu Chang
元智大學	Jan-20	Cognitive learning performance assessment and analysis with CSCL applied on the NetGuru platform and CSPL applied on the TAoD platform for the network	Yung-Hui Chen; Wei-Chun Lee; Chun-Hsiung Tseng; Lawrence Y. Deng; Chuan-Yu Chang; Long-He Lee
元智大學	2020/9/28	Limited-Anchor Deep Neural Network for Moving Object Detection	林智揚; Han-Yi Huang; Wei-Yang Lin; Chuan-Yu Chang; Wen-Thong Chang; Yih-Kuen Jan
元智大學	2019-05-20	Deep Learning based Moving Object Detection for Video Surveillance	林智揚; Han-Yi Huang; Wei-Yang Lin; Chien-Cheng Lee; Chuan-Yu Chang
元智大學	2019-05-20	Deep Learning based Moving Object Detection for Video Surveillance	林智揚; Han-Yi Huang; Wei-Yang Lin; Chien-Cheng Lee; Chuan-Yu Chang
國立臺灣海洋大學	2011-11	Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection	Chun-Hsi Li; Chuan-Yu Chang; MuDer Jeng
國立臺灣海洋大學	2009-12	Wafer Defect Inspection by Neural Analysis of Region Features	Chuan-Yu Chang; Chun-Hsi Li; Yung-Chi Chang; MuDer Jeng
國立臺灣海洋大學	2009-03-31	Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection	Chuan-Yu Chang;Chun-Hsi Li;Si-Yan Lin;MuDer Jeng
國立臺灣海洋大學	2008-02-01	Integrated Two Hopfield Neural Networks for Automatic LED Defect Inspection	Chuan-Yu Chang;Chuan-Wang Chang;Chuan-Wang Chang;Mu-Der Jeng
國立臺灣海洋大學	2008-01	Learning vector quantization neural networks for LED wafer defect inspection	Chuan-Yu Chang; Chin-Huang Chang; Chun-Hsi Li; MuDer Jeng
亞洲大學	2007-12-20	A Novel Superquadric Fitting based on Radial Euclidean Distance for 3D Objects Fitting	Wu-Chih Hu;Chuan-Yu Chang
國立臺灣海洋大學	2007-01	An unsupervised neural network approach for automatic semiconductor wafer defect inspection	Chuan-Yu Chang;ChunHsi Li;Jia-Wei Chang; MuDer Jeng
國立臺灣海洋大學	2007	Inspection Results of the Learning Vector Quantization Neural Networks Based LED Wafer Defect Inspection System	Chuan-Yu Chang;Chin-Huang Chang;Chun-Hsi Li;MuDer Jeng

Showing items 1-13 of 13 (1 Page(s) Totally)
1
View [10|25|50] records per page