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Taiwan Academic Institutional Repository >
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"chuang ching te"
Showing items 36-45 of 221 (23 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:56:15Z |
Impact of Random Variations on Cell Stability and Write-Ability of Low-Voltage SRAMs Using Monolayer and Bilayer Transition Metal Dichalcogenide (TMD) MOSFETs
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Yu, Chang-Hung; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:55:34Z |
A 0.35 V, 375 kHz, 5.43 mu W, 40 nm, 128 kb, symmetrical 10T subthreshold SRAM with tri-state bit-line
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Wu, Shang-Lin; Lu, Chien-Yu; Tu, Ming-Hsien; Huang, Huan-Shun; Lee, Kuen-Di; Kao, Yung-Shin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:50:15Z |
Integration of Neural Sensing Microsystem with TSV-embedded Dissolvable mu-Needles Array, Biocompatible Flexible Interposer, and Neural Recording Circuits
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Huang, Yu-Chieh; Hu, Yu-Chen; Huang, Po-Tsang; Wu, Shang-Lin; You, Yan-Huei; Chen, Jr-Ming; Huang, Yan-Yu; Chang, Hsiao-Chun; Lin, Yen-Han; Duann, Jeng-Ren; Chiu, Tzai-Wen; Hwang, Wei; Chuang, Ching-Te; Chiou, Jin-Chern; Chen, Kuan-Neng |
| 國立交通大學 |
2017-04-21T06:50:10Z |
Evaluation of Energy-Efficient Latch Circuits with Hybrid Tunneling FET and FinFET Devices for Ultra-Low-Voltage Applications
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Wu, Tse-Ching; Chen, Chien-Ju; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:50:10Z |
Energy-Efficient Gas Recognition System with Event-Driven Power Control
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Huang, Chun-Ying; Huang, Po-Tsang; Yang, Chih-Chao; Chuang, Ching-Te; Hwang, Wei |
| 國立交通大學 |
2017-04-21T06:50:07Z |
An Ultra-High-Density 256-channel/25mm(2) Neural Sensing Microsystem using TSV-embedded Neural Probes
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Huang, Yu-Chieh; Huang, Po-Tsang; Wu, Shang-Lin; Hui, Yu-Chen; You, Yan-Huei; Chen, Jr-Ming; Huang, Yan-Yu; Chang, Hsiao-Chun; Lin, Yen-Han; Duann, Jeng-Ren; Chiu, Tzai-Wen; Hwang, Wei; Chen, Kuan-Neng; Chuang, Ching-Te; Chiou, Jin-Chern |
| 國立交通大學 |
2017-04-21T06:50:06Z |
A Subthreshold SRAM with Embedded Data-Aware Write-Assist and Adaptive Data-Aware Keeper
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Chiu, Yi-Wei; Hu, Yu-Hao; Zhao, Jun-Kai; Jou, Shyh-Jye; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:50:05Z |
Investigation of BTI Reliability for Monolithic 3D 6T SRAM with Ultra-thin-body GeOI MOSFETs
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Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:57Z |
Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and Logic Circuits
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Chen, Chien-Ju; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:47Z |
UTB GeOI 6T SRAM Cell and Sense Amplifier considering BTI Reliability
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Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
Showing items 36-45 of 221 (23 Page(s) Totally)
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