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"chuang ching te"的相关文件
显示项目 171-195 / 221 (共9页)
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| 國立交通大學 |
2014-12-08T15:33:15Z |
Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM
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Yang, Hao-I.; Yang, Shyh-Chyi; Hwang, Wei; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:43Z |
Analysis of Germanium FinFET Logic Circuits and SRAMs with Asymmetric Gate to Source/Drain Underlap Devices
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:43Z |
Design and Optimization of 6T SRAM using Vertically Stacked Nanowire MOSFETs
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Tsai, Ming-Fu; Fan, Ming-Long; Pao, Chia-Hao; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:20Z |
Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Investigation of Single-Trap-Induced Random Telegraph Noise for Tunnel FET Based Devices, 8T SRAM Cell, and Sense Amplifiers
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Device Design and Analysis of Logic Circuits and SRAMs for Germanium FinFETs on SOI and Bulk Substrates
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:31:54Z |
Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection
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Ghosh, Amlan; Rao, Rahul M.; Kim, Jae-Joon; Chuang, Ching-Te; Brown, Richard B. |
| 國立交通大學 |
2014-12-08T15:31:13Z |
Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold Operation
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:31:09Z |
Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate Devices
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Yang, Hao-I; Hwang, Wei; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:49Z |
Investigation of ICP Parameters for Smooth TSVs and Following Cu Plating Process in 3D Integration
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Chiang, Cheng-Hao; Hu, Yu-Chen; Chen, Kuo-Hua; Chiu, Chi-Tsung; Chuang, Ching-Te; Hwang, Wei; Chiou, Jin-Chern; Tong, Ho-Ming; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:30:49Z |
Micro-masking Removal of TSV and Cavity during ICP Etching Using Parameter Control in 3D and MEMS Integrations
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Hu, Yu-Chen; Chiang, Cheng-Hao; Chen, Kuo-Hua; Chiu, Chi-Tsung; Chuang, Ching-Te; Hwang, Wei; Chiou, Jin-Chern; Tong, Ho-Ming; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:30:35Z |
Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nein; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:30Z |
Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM Cells
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Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:25Z |
Design and Analysis of Robust Tunneling FET SRAM
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Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:07Z |
Testing Strategies for a 9T Sub-threshold SRAM
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Yang, Hao-Yu; Lin, Chen-Wei; Chen, Hung-Hsin; Chao, Mango C. -T.; Tu, Ming-Hsien; Jou, Shyh-Jye; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:06Z |
High-Performance 0.6V V-MIN 55nm 1.0Mb 6T SRAM with Adaptive BL Bleeder
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Yang, Hao-I; Lin, Yi-Wei; Hsia, Mao-Chih; Lin, Geng-Cing; Chang, Chi-Shin; Chen, Yin-Nien; Chuang, Ching-Te; Hwang, Wei; Jou, Shyh-Jye; Lien, Nan-Chun; Li, Hung-Yu; Lee, Kuen-Di; Shih, Wei-Chiang; Wu, Ya-Ping; Lee, Wen-Ta; Hsu, Chih-Chiang |
| 國立交通大學 |
2014-12-08T15:30:06Z |
An All-Digital Bit Transistor Characterization Scheme for CMOS 6T SRAM Array
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Lin, Geng-Cing; Wang, Shao-Cheng; Lin, Yi-Wei; Tsai, Ming-Chien; Chuang, Ching-Te; Jou, Shyh-Jye; Lien, Nan-Chun; Shih, Wei-Chiang; Lee, Kuen-Di; Chu, Jyun-Kai |
| 國立交通大學 |
2014-12-08T15:30:04Z |
Variation Tolerant CLSAs for Nanoscale Bulk-CMOS and FinFET SRAM
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Tsai, Ming-Fu; Tsai, Jen-Huan; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:30:03Z |
Design and Implementation of Dynamic Word-Line Pulse Write Margin Monitor for SRAM
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Wang, Shao-Cheng; Lin, Geng-Cing; Lin, Yi-Wei; Tsai, Ming-Chien; Chiu, Yi-Wei; Jou, Shyh-Jye; Chuang, Ching-Te; Lien, Nan-Chun; Shih, Wei-Chiang; Lee, Kuen-Di; Chu, Jyun-Kai |
| 國立交通大學 |
2014-12-08T15:30:03Z |
A Comprehensive Comparative Analysis of FinFET and Trigate Device, SRAM and Logic Circuits
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Pao, Chia-Hao; Fan, Ming-Long; Tsai, Ming-Fu; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:29:40Z |
A 0.33-V, 500-kHz, 3.94-mu W 40-nm 72-Kb 9T Subthreshold SRAM With Ripple Bit-Line Structure and Negative Bit-Line Write-Assist
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Lu, Chien-Yu; Tu, Ming-Hsien; Yang, Hao-I; Wu, Ya-Ping; Huang, Huan-Shun; Lin, Yuh-Jiun; Lee, Kuen-Di; Kao, Yung-Shin; Chuang, Ching-Te; Jou, Shyh-Jye; Hwang, Wei |
| 國立交通大學 |
2014-12-08T15:29:40Z |
Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:28:05Z |
Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic Circuits
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Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:25:40Z |
TIMING CONTROL DEGRADATION AND NBTI/PBTI TOLERANT DESIGN FOR WRITE-REPLICA CIRCUIT IN NANOSCALE CMOS SRAM
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Yang, Shyh-Chyi; Yang, Hao-I; Chuang, Ching-Te; Hwang, Wei |
| 國立交通大學 |
2014-12-08T15:25:24Z |
Impacts of Contact Resistance and NBTI/PBTI on SRAM with High-kappa Metal-Gate Devices
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Yang, Hao-I; Chuang, Ching-Te; Hwang, Wei |
显示项目 171-195 / 221 (共9页)
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每页显示[10|25|50]项目
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