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Showing items 41-50 of 221 (23 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:50:07Z |
An Ultra-High-Density 256-channel/25mm(2) Neural Sensing Microsystem using TSV-embedded Neural Probes
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Huang, Yu-Chieh; Huang, Po-Tsang; Wu, Shang-Lin; Hui, Yu-Chen; You, Yan-Huei; Chen, Jr-Ming; Huang, Yan-Yu; Chang, Hsiao-Chun; Lin, Yen-Han; Duann, Jeng-Ren; Chiu, Tzai-Wen; Hwang, Wei; Chen, Kuan-Neng; Chuang, Ching-Te; Chiou, Jin-Chern |
| 國立交通大學 |
2017-04-21T06:50:06Z |
A Subthreshold SRAM with Embedded Data-Aware Write-Assist and Adaptive Data-Aware Keeper
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Chiu, Yi-Wei; Hu, Yu-Hao; Zhao, Jun-Kai; Jou, Shyh-Jye; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:50:05Z |
Investigation of BTI Reliability for Monolithic 3D 6T SRAM with Ultra-thin-body GeOI MOSFETs
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Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:57Z |
Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and Logic Circuits
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Chen, Chien-Ju; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:47Z |
UTB GeOI 6T SRAM Cell and Sense Amplifier considering BTI Reliability
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Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:42Z |
0.339fJ/bit/search Energy-Efficient TCAM Macro Design in 40nm LP CMOS
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Huang, Po-Tsang; Lai, Shu-Lin; Chuang, Ching-Te; Hwang, Wei; Huang, Jason; Hu, Angelo; Kan, Paul; Jia, Michael; Lv, Kimi; Zhang, Bright |
| 國立交通大學 |
2017-04-21T06:49:40Z |
Impact of NBTI and PBTI in SRAM Bit-cells: Relative Sensitivities and Guidelines for Application-Specific Target Stability/Performance
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Bansal, Aditya; Rao, Rahul; Kim, Jae-Joon; Zafar, Sufi; Stathis, James H.; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:37Z |
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
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Kim, Jae-Joon; Rao, Rahul; Mukhopadhyay, Saibal; Chuang, Ching-Te |
| 國立交通大學 |
2017-04-21T06:49:36Z |
Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide
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Kim, Keunwoo; Kuang, Jente B.; Gebara, Fadi; Ngo, Hung C.; Chuang, Ching-Te; Nowka, Kevin J. |
| 國立交通大學 |
2017-04-21T06:49:31Z |
A Precise Negative Bias Temperature Instability Sensor using Slew-Rate Monitor Circuitry
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Ghosh, Amlan; Brown, Richard B.; Rao, Rahul M.; Chuang, Ching-Te |
Showing items 41-50 of 221 (23 Page(s) Totally)
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