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"chuang j b"
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| 臺大學術典藏 |
2018-09-10T07:29:09Z |
Constant bias-temperature and constant charge-temperature agings for silicon oxide films of MOS devices
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Hwu, J.-G.;Chuang, J.-B.;Fu, S.-L.; Hwu, J.-G.; Chuang, J.-B.; Fu, S.-L.; JENN-GWO HWU |
| 國立臺灣大學 |
1989 |
Constant Bias-Temperature and Constant Charge-Temperature Agings for Silicon Oxide Films of MOS Devices
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胡振國; Chuang, J. B.; Fu, S. J.; Hwu, Jenn-Gwo; Chuang, J. B.; Fu, S. J. |
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