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Showing items 1-8 of 8  (1 Page(s) Totally)
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Institution Date Title Author
國立臺灣海洋大學 2011-11 Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection Chun-Hsi Li; Chuan-Yu Chang; MuDer Jeng
國立臺灣海洋大學 2011 運用計算智能於自動化切割後發光二極體晶圓缺陷檢測 Chun-Hsi Li; 李俊錫
國立臺灣海洋大學 2011 運用計算智能於自動化切割後發光二極體晶圓缺陷檢測 Chun-Hsi Li; 李俊錫
國立臺灣海洋大學 2011 Applying Regional Level-Set Formulation to Post-Sawing Four-element LED Wafer Inspection Chun-Hsi Li; huan-Yu Chang; MuDer Jeng
國立臺灣海洋大學 2009-12 Wafer Defect Inspection by Neural Analysis of Region Features Chuan-Yu Chang; Chun-Hsi Li; Yung-Chi Chang; MuDer Jeng
國立臺灣海洋大學 2009-03-31 Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection Chuan-Yu Chang;Chun-Hsi Li;Si-Yan Lin;MuDer Jeng
國立臺灣海洋大學 2008-01 Learning vector quantization neural networks for LED wafer defect inspection Chuan-Yu Chang; Chin-Huang Chang; Chun-Hsi Li; MuDer Jeng
國立臺灣海洋大學 2007 Inspection Results of the Learning Vector Quantization Neural Networks Based LED Wafer Defect Inspection System Chuan-Yu Chang;Chin-Huang Chang;Chun-Hsi Li;MuDer Jeng

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