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Showing items 116-118 of 118  (3 Page(s) Totally)
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Institution Date Title Author
國立高雄師範大學 1989-11 Reconfigurable Testable Bit-Serial Multiplier for DSP Applications 楊中皇; Magdy A. Bayoumi ;Chung-Huang Yang
國立高雄師範大學 1987-05 A Fault Tolerant Testable Module for Wafer Scale Integrated Systems, 楊中皇; Magdy A. Bayoumi ;Chung-Huang Yang
國立高雄師範大學 1986 A Fault-Tolerant Testable Multiplier for DSP Applications, 楊中皇; Magdy A. Bayoumi;Rajat Roy;Chung-Huang Yang

Showing items 116-118 of 118  (3 Page(s) Totally)
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