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Showing items 11-14 of 14  (1 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:19:03Z Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pey, KL; Trigg, A; Chung, S
國立交通大學 2014-12-08T15:04:38Z A PRECISION EXPERIMENT ON ELECTRONS, PHOTONS AND MUONS AT LHC AZIZ, T; BOCK, R; BRAUNSCHWEIG, W; GEULIG, E; HILGERS, K; HILLEMANNS, H; KARPINSKI, W; KORNADT, O; KRENZ, W; LEHMANN, T; LINDEMANN, B; LUBELSMEYER, K; NIPPE, A; PANDOULAS, D; PEI, YJ; ROHNER, M; SCHMITZ, D; SCHOENTAG, M; SCHULZ, A; DRATZIG, V; SCHWENKE, J; SCHWERING, G; SIEDLING, R; SUBHANI, K; TOPOROWSKY, M; WALLRAFF, W; WEBER, A; XIAO, N; ZENG, Y; ZHOU, JF; ZITZEN, S; BLAISING, JJ; COIGNET, G; LEBEAU, M; SCHNEEGANS, M; CHIEN, CY; FISHER, PH; PAUL, T; PEVSNER, A; SPARTIOTIS, C; LI, H; WANG, WM; YU, BT; ZHOU, SM; BAI, JZ; CHEN, C; CHEN, GM; CHEN, HS; CHEN, SN; DAI, GL; FANG, C; HE, JT; HU, XG; JIN, BN; LAN, HB; LI, BM; LI, HT; LI, RB; LIU, HM; LU, YS; MA, JM; MAO, YF; QU, YH; SHEN, J; TANG, XW; TUNG, KL; WANG, F; WANG, JH; WEI, CL; WU, RJ; XIE, PP; YAN, J; YANG, CG; YANG, KS; YU, ZQ; ZHENG, GR; ZHU, GY; ZHANG, B; CHEN, WZ; CHEN, ZM; GUO, ZY; LIANG, YN; LIU, GL; NAN, DH; QU, JS; YIN, CY; ZHANG, CZ; BLOCK, F; BOSCHERINI, D; BRUNI, G; BRUNI, P; ROMEO, GC; CHIARINI, M; CINDOLO, F; CIRALLI, F; DAURIA, S; DELPAPA, C; FRASCONI, F; GIUSTI, P; IACOBUCCI, G; LEVI, G; MACCARONE, G; MARGOTTI, A; MASSAM, T; NANIA, R; PALMONARI, F; SARTORELLI, G; TIMELLINI, R; TZAMARIAS, S; BANERJEE, S; CHENDVANKAR, SR; DESHPANDE, PV; GANGULI, SN; GUPTA, SK; GURTU, A; MALHOTRA, PK; MAZUMDAR, K; RAGHAVAN, R; SHANKAR, K; SUDHAKAR, K; TONWAR, SC; AHLEN, S; MARIN, A; ZHOU, B; ANGELESCU, T; COTOROBAI, F; GHEORDANESCU, N; MIHUL, A; POP, D; BENCZE, GL; CSORGO, T; DENES, E; HOSVATTI, I; LEVAI, P; PRISZUYAK, M; TOTH, J; URBAN, L; ZIMANYI, J; KUMAR, KS; KUNIN, A; SCOTT, I; STRAUCH, K; ANDERSON, AL; BECKER, U; BERGES, P; BURGER, JD; CAPELL, M; CHANG, YH; CHEN, J; CHEN, M; CHUNG, S; CLARE, L; CLARE, R; DAI, TS; EPPLING, FJ; KLIMENTOV, A; KOUTSENKO, V; KRAMER, T; LEBEDEV, A; LUCKEY, D; RUBBIA, A; SARAKINOS, MS; SHOTKIN, S; SMITH, B; STEUER, M; TING, SCC; TING, SM; WYSLOUCH, B; GANTMAHER, V; GRAZJILIS, V; KLASSEN, N; OSSIPYAN, Y; SCHEGELEV, I; TIMOFEEV, V; CHEN, A; LIN, WT; BARILLARI, T; SCHIOPPA, M; SUSINNO, G; ADRIANI, O; CARTACCI, AM; CIANCAGLINI, G; CIVININI, C; DALESSANDRO, R; GALLO, E; MESCHINI, M; POJIDAEV, V; SPILLANTINI, P; WANG, YF; ANZIVINO, G; DEPASQUALE, S; VOTANO, L; ALCARAZ, J; ANSELMO, F; BARILLERE, R; BRUGNOLA, G; COLINO, N; DESALVO, R; FELCINI, M; FORD, P; GERWIG, H; HERVE, A; INNOCENTE, V; LACOMMARE, G; LARSEN, H; LAURENTI, G; LECOQ, P; LEGOFF, JM; MARINO, M; NEMOZ, C; PIERI, M; SALICIO, J; WILLIAMS, C; WITTGENSTEIN, F; ZICHICHI, A; BOURQUIN, M; AYAD, R; BENCHEICK, B; CAI, XD; CHATURVEDI, UK; CHEN, WY; CUI, XT; CUI, XY; DOVA, MT; GU, C; HASAN, AH; HATZIFOTIADOU, D; HE, HL; HU, G; KHAN, RA; KAUR, M; KHOKHAR, S; VALVERDE, JL; FLORIAN, EL; LIN, Q; LIU, LB; MI, Y; MIR, Y; MOULAI, NE; NIAZ, MA; QIAN, S; QURESHI, KN; REN, Z; RIZVI, HA; SEHGAL, R; SHABELSKI, YM; SUN, JY; SUN, LZ; SYED, AA; VIKAS, P; VIKAS, U; WADHWA, M; WANG, KL; WANG, ZM; WU, SX; XIA, XM; YANG, CY; YANG, G; YE, CH; YE, Q; YE, Y; YOU, JM; YUNUS, N; ZAMORA, GY; ZENG, M; ZHANG, ZP; ZHAO, M; DING, ZS; GE, MZ; HAN, GY; JIN, M; TANG, Y; WANG, R; YU, CW; ZHANG, XS; AN, Q; CHEN, HF; GAO, Q; GONG, ZF; GU, CH; JIANG, Y; LI, C; LIN, ZY; LIU, YY; LU, WZ; MA, WG; WANG, CR; WU, J; XU, ZZ; YANG, BZ; YE, JB; YE, SX; ZHOU, MH; SU, S; LEE, YY; NI, WT; YANG, YC; YEH, SC; YEN, HC; TAKAHASHI, Y; CHEN, HC; HAN, JR; HE, M; JIANG, MH; LI, Q; ZHANG, NJ; ZHANG, XY; ROSSELET, P; LEBRUN, P; MARTIN, JP; AGUILARBENITEZ, M; ARCE, P; BERDUGO, J; BURGOS, C; CERRADA, M; FERNANDEZ, D; FERNANDEZ, G; GARCIAABIA, P; GONZALEZ, E; MANA, C; MARTINEZLASO, L; RODRIGUEZ, FJ; ROMERO, L; SALICIO, JM; WILLMOTT, C; BASCHIROTTO, A; BOSETTI, M; CASTELLO, R; PENSOTTI, S; RANCOITA, PG; RATTAGGI, M; TERZI, G; AKIMOV, DY; AREFIEV, A; BOLOZDYNYA, AI; CHURAKOV, DL; GALAKTIONOV, Y; KOLOTAEV, Y; MALININ, A; PLYASKIN, V; ROZJKOV, A; SHUMILOV, E; SHOUTKO, V; VETLITSKY, I; VOROBIEV, I; BRAGIN, LA; CHERNOPLEKOV, N; KARPUSHOV, I; KLIMENKO, E; LELEKHOV, S; MALOFEEV, A; MOKHNATUK, V; NOVIKOV, S; VELIKHOV, E; ALOISIO, A; ALVIGGI, MG; BRAMBILLA, E; CARLINO, G; DEASMUNDIS, R; LANZANO, S; LISTA, L; PAOLUCCI, P; PATRICELLI, S; PICCOLO, D; SCIACCA, C; RAZIS, P; SEGUINOT, J; YPSILANTIS, T; GRATTA, G; GRUENEWALD, M; KIRKBY, D; MOUNT, R; NEWMAN, H; SHI, XR; TULLY, C; ZACCARDELLI, C; ZHU, RY; BATTISTON, R; BILEI, GM; CARIA, M; CHECCUCI, B; EASO, S; KRASTEV, V; PAULUZZI, M; SERVOLI, L; WANG, S; CIFARELLI, L; DENES, P; GUPTA, V; PIROUE, PA; STONE, H; STICKLAND, DP; WRIGHT, D; BARONE, L; BORGIA, B; CESARONI, F; DENOTARISTEFANI, F; DIEMOZ, M; DIONISI, C; FALCIANO, S; LEONARDI, E; LONGO, E; LUCI, C; LUMINARI, L; MIRABELLI, G; ORGANTINI, G; RESCIGNO, M; VALENTE, E; ANDREEV, V; ALKAHAZOV, G; BYKOV, A; KAPINOS, P; KIM, V; TSAREGORODTSEV, A; VOROBIEV, A; ZALITE, Y; SHEN, H; WU, WM; PAN, H; QIAN, C; SI, C; XIE, S; XU, B; YANG, W; ZHANG, S; FANG, XL; FENG, CD; FENG, XQ; GAO, HX; GAO, M; GU, PX; GUO, JK; HU, GQ; HU, YL; HUA, SK; LI, PJ; QI, ZD; SHEN, DZ; SHI, EW; SU, WT; WANG, XX; WEI, ZY; XIE, YY; XU, L; XUE, ZL; YAN, DS; YIN, ZW; YUAN, XL; ZHANG, YF; ZHAO, GM; ZHAO, YL; ZHONG, WZ; ZHOU, RM; WALENTA, AH; SHIVAROV, N; CHOI, MT; KIM, JK; KIM, YG; KIM, SC; SON, D; HSU, LS; LIN, WL; DIBITONTO, D; PENNINGTON, T; BUJAK, A; CARMONY, DD; GUTAY, LJ; MCMAHON, T; SPRINGFELLOW, BC; ANDERHUB, H; BEHNER, F; BEHRENS, J; BETEV, B; BILAND, A; DHINA, M; FABER, G; FREUDENREICH, K; HANSLI, M; HOFER, H; HORVATH, I; JONGMANNS, M; LECOMTE, P; LECOULTRE, P; MACDERMOTT, M; MAOLINBAY, M; MARCHESINI, P; MCNALLY, D; NESSITEDALDI, F; NEYER, C; PARADISO, J; PAUSS, F; POHL, M; RAHALCALLOT, G; REN, D; SCHOLZ, N; ROSER, U; RYKACZEWSKI, H; SUTER, H; ULBRICHT, J; VIERTEL, G; VONGUNTEN, HP; WALDMEIER, S; WEBER, J; ZEMP, P
國立臺灣科技大學 2012 Test coverage optimization for large code problems Lin, Y.-D.;Chou, C.-H.;Lai, Y.-C.;Huang, T.-Y.;Chung, S.;Hung, J.-T.;Lin, F.C.
國立臺灣科技大學 2007 Intelligent design of diagnosable systems: A case study of semiconductor manufacturing machines Wen Y.; Chung S.; Jeng L.; Jeng M.

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