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Institution Date Title Author
國立交通大學 2018-01-24T07:43:25Z 三維電晶體由製程與長時間操作導致電特性變異 之多面向探討 謝易叡; 莊紹勳; Hsieh, E-Ray; Chung, Steve
國立交通大學 2017-04-21T06:49:30Z The Path Finding of Gate Dielectric Breakdown in Advanced High-k Metal-Gate CMOS Devices Chung, Steve
國立交通大學 2014-12-12T01:37:24Z 二位元分離式閘極氮化矽快閃式記憶體之漏電機制探討 何永涵; Ho, Yung-Hang; 莊紹勳; Chung, Steve
國立交通大學 2014-12-12T01:37:14Z 二氧化鉿基底電阻式記憶體之動態轉換物理模型 曾元宏; Tseng, Yuan-Hong; 莊紹勳; Chung, Steve

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