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Taiwan Academic Institutional Repository >
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"chung steve s"
Showing items 106-115 of 136 (14 Page(s) Totally)
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| 國立交通大學 |
2014-12-12T01:27:07Z |
隨機電報訊號量測於高閘極介電層N通道金氧半電晶體汲極電流波動之探討
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張健宏; Chang, Chien-Hung; 莊紹勳; Chung, Steve S. |
| 國立交通大學 |
2014-12-12T01:27:03Z |
奈米級蕭特基金氧半場效電晶體之載子傳輸特性與通道背向散射研究
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鄧安舜; Teng, An-Shun; 莊紹勳; Chung, Steve S. |
| 國立交通大學 |
2014-12-12T01:27:01Z |
隨機電報訊號量測法應用於前瞻CMOS元件應變技術引致的汲極電流不穩定性之研究
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林米華; Lin, Mi-Hua; 莊紹勳; Chung, Steve S. |
| 國立交通大學 |
2014-12-08T15:48:21Z |
New Observation of an Abnormal Leakage Current in Advanced CMOS Devices with Short Channel Lengths Down to 50nm and Beyond
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Hsieh, E. R.; Chung, Steve S.; Lin, Y. H.; Tsai, C. H.; Liu, P. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:47:46Z |
The investigation of charge loss mechanism in a two-bit wrapped-gate nitride storage nonvolatile memory
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Ho, Y. H.; Chung, Steve S.; Chen, H. H. |
| 國立交通大學 |
2014-12-08T15:45:54Z |
The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach
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Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:45:53Z |
More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable Reliability
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Chung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W. |
| 國立交通大學 |
2014-12-08T15:39:25Z |
The Understanding of Strain-Induced Device Degradation in Advanced MOSFETs with Process-Induced Strain Technology of 65nm Node and Beyond
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Lin, M. H.; Hsieh, E. R.; Chung, Steve S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H. |
| 國立交通大學 |
2014-12-08T15:36:22Z |
The understanding of the drain-current fluctuation in a silicon-carbon source-drain strained n-channel metal-oxide-semiconductor field-effect transistors
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Hsieh, E. R.; Chung, Steve S. |
| 國立交通大學 |
2014-12-08T15:33:48Z |
The Variability Issues in Small Scale Trigate CMOS Devices: Random Dopant and Trap Induced Fluctuations
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Chung, Steve S. |
Showing items 106-115 of 136 (14 Page(s) Totally)
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