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Taiwan Academic Institutional Repository >
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"chung steve s"
Showing items 21-30 of 136 (14 Page(s) Totally) << < 1 2 3 4 5 6 7 8 9 10 > >> View [10|25|50] records per page
| 國立交通大學 |
2018-08-21T05:53:03Z |
A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path
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Hsieh, E. Ray; Kuo, Yen Chen; Cheng, Chih-Hung; Kuo, Jing Ling; Jiang, Meng-Ru; Lin, Jian-Li; Chen, Hung-Wen; Chung, Steve S.; Liu, Chuan-Hsi; Chen, Tse Pu; Huang, Shih An; Chen, Tai-Ju; Cheng, Osbert |
| 國立交通大學 |
2018-01-24T07:42:48Z |
新穎高性能鰭式電晶體結構 及其高頻特性分析
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林建里; 莊紹勳; Lin, Jian-Li; Chung, Steve-S. |
| 國立交通大學 |
2018-01-24T07:42:00Z |
14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響
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江孟儒; 莊紹勳; Jiang, Meng-Ru; Chung, Steve S. |
| 國立交通大學 |
2018-01-24T07:41:58Z |
一種新穎的鰭式電晶體可程式神經陣列 在人工神經網路的應用
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陳泓文; 莊紹勳; Chen, Hung-Wen; Chung, Steve S. |
| 國立交通大學 |
2017-04-21T06:56:06Z |
A theoretical and experimental evaluation of surface roughness variation in trigate metal oxide semiconductor field effect transistors
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Hsieh, E. R.; Chung, Steve S. |
| 國立交通大學 |
2017-04-21T06:50:15Z |
Fully CMOS Compatible 3D Vertical RRAM with Self-aligned Self-selective Cell Enabling Sub-5nm Scaling
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Xu, Xiaoxin; Luo, Qing; Gong, Tiancheng; Lv, Hangbing; Long, Shibing; Liu, Qi; Chung, Steve S.; Li, Jing; Liu, Ming |
| 國立交通大學 |
2017-04-21T06:50:15Z |
A Comprehensive Transport Model for High Performance HEMTs Considering the Parasitic Resistance and Capacitance Effects
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Hung, C. M.; Li, K. C.; Hsieh, E. R.; Wang, C. T.; Kou, C. I.; Chang, Edward Y.; Chung, Steve S. |
| 國立交通大學 |
2017-04-21T06:50:15Z |
A New Variation Plot to Examine the Interfacial-dipole Induced Work-function Variation in Advanced High-k Metal-gate CMOS Devices
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Hsieh, E. R.; Wang, Y. D.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Hsu, S. |
| 國立交通大學 |
2017-04-21T06:50:00Z |
The Experimental Demonstration of the BTI-Induced Breakdown Path in 28nm High-k Metal Gate Technology CMOS Devices
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Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T. |
| 國立交通大學 |
2017-04-21T06:50:00Z |
The Process and Stress-Induced Variability Issues of Trigate CMOS Devices
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Chung, Steve S. |
Showing items 21-30 of 136 (14 Page(s) Totally) << < 1 2 3 4 5 6 7 8 9 10 > >> View [10|25|50] records per page
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