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"chung steve s"的相關文件
顯示項目 6-15 / 136 (共14頁) 1 2 3 4 5 6 7 8 9 10 > >> 每頁顯示[10|25|50]項目
| 國立交通大學 |
2020-01-02T00:03:27Z |
The Understanding of Gate Capacitance Matching on Achieving a High Performance NC MOSFET with Sufficient Mobility
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Chiang, C. K.; Husan, P.; Lou, Y. C.; Li, F. L.; Hsieh, E. R.; Liu, C. H.; Chung, Steve S. |
| 國立交通大學 |
2019-10-05T00:09:43Z |
Embedded Resistive Switching Non-volatile Memory Technology for 28nm and Beyond High-k Metal-gate Generations
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Chung, Steve S. |
| 國立交通大學 |
2019-09-02T07:45:40Z |
The Understanding of Breakdown Path in Both High-k Metal-Gate CMOS and Resistance RAM by the RTN Measurement
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Chung, Steve S. |
| 國立交通大學 |
2019-06-03T01:09:17Z |
An Energy Efficient FinFET-based Field Programmable Synapse Array (FPSA) Feasible for One-shot Learning on EDGE AI
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Kuo, J. L.; Chen, H. W.; Hsieh, E. R.; Chung, Steve S.; Chen, T. P.; Huang, S. A.; Chen, T. J.; Cheng, Osbert |
| 國立交通大學 |
2019-04-02T06:04:38Z |
Nonvolatile Crossbar 2D2R TCAM with Cell Size of 16.3 F-2 and K-means Clustering for Power Reduction
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Zhou, Keji; Xue, Xiaoyong; Yang, Jianguo; Xu, Xiaoxin; Lv, Hangbing; Wang, Mingyu; Jing, Ming'e; Liu, Wenjun; Zeng, Xiaoyang; Chung, Steve S.; Li, Jing; Liu, Ming |
| 國立交通大學 |
2019-04-02T06:04:37Z |
Experimental Observation on the Random Dopant Fluctuation of Small Scale Trigate CMOS Devices
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Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:04:27Z |
Resistive Switching Non-volatile Memory Feasible for 28nm and Beyond Embedded Logic CMOS Technology
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Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:04:26Z |
A Novel ReWritable One-Time-Programming OTP (RW-OTP) Realized by Dielectric-fuse RRAM Devices Featuring Ultra-High Reliable Retention and Good Endurance for Embedded Applications
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Cheng, H. W.; Hsieh, E. R.; Huang, Z. H.; Chuang, C. H.; Chen, C. H.; Li, F. L.; Lo, Y. M.; Liu, C. H.; Chung, Steve S. |
| 國立交通大學 |
2019-04-02T06:00:32Z |
The investigation of charge loss mechanism in a two-bit wrapped-gate nitride storage nonvolatile memory
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Ho, Y. H.; Chung, Steve S.; Chen, H. H. |
| 國立交通大學 |
2019-04-02T05:58:37Z |
An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET
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Hsieh, E. Ray; Jiang, Meng-Ru; Lin, Jian-Li; Chung, Steve S.; Chen, Tse Pu; Huang, Shih An; Chen, Tai-Ju; Cheng, Osbert |
顯示項目 6-15 / 136 (共14頁) 1 2 3 4 5 6 7 8 9 10 > >> 每頁顯示[10|25|50]項目
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