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"chung wei min"
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| 國立交通大學 |
2020-10-05T02:01:57Z |
A Study of the Relationship Between Endurance and Retention Reliability for a HfOx-Based Resistive Switching Memory
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Chung, Wei-Min; Chang, Yao-Feng; Hsu, Yu-Lin; Chen, Y. -C. Daphne; Lin, Chao-Cheng; Lin, Chang-Hsieh; Leu, Jihperng |
| 國立交通大學 |
2020-07-01T05:22:12Z |
SiCxNy-based resistive and threshold switching by using single precursor plasma-enhanced atomic layer deposition
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Hsu, Yu-Lin; Chang, Yao-Feng; Chung, Wei-Min; Chen, Ying-Chen; Lin, Chao-Cheng; Leu, Jihperng |
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