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"chung y t"的相關文件
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| 臺大學術典藏 |
2020-03-02T07:40:12Z |
Ion condensation behavior and dynamics of water molecules surrounding the sodium poly(methacrylic acid) chain in water: A molecular dynamics study
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Chung, Y.-T.; Huang, C.-I.; CHING-I HUANG |
| 國立交通大學 |
2019-04-02T05:59:51Z |
Variations of V-t Retention Loss in a SONOS Flash Memory Due to a Current-Path Percolation Effect
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Chou, Y. L.; Chung, Y. T.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 臺大學術典藏 |
2018-09-10T14:57:32Z |
Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control
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Liu, S. W.;Lee, C. C.;Chung, Y. T.;Lee, J. H.;Chen, C. T.;Wang, J. K.; Liu, S. W.; Lee, C. C.; Chung, Y. T.; Lee, J. H.; Chen, C. T.; Wang, J. K.; JIUN-HAW LEE |
| 臺大學術典藏 |
2018-09-10T09:44:21Z |
An ultrasensitive nanowire-transistor biosensor for detecting dopamine release from living pc12 cells under hypoxic stimulation
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Li, B.-R.; Hsieh, Y.-J.; Chen, Y.-X.; Chung, Y.-T.; Pan, C.-Y.; Chen, Y.-T.; Li, B.-R.; Hsieh, Y.-J.; Chen, Y.-X.; Chung, Y.-T.; Pan, C.-Y.; Chen, Y.-T.; YIT-TSONG CHEN; CHIEN-YUAN PAN |
| 臺大學術典藏 |
2018-09-10T07:28:09Z |
Crystal structure and electronic and thermal properties of TbFeAsO0.85
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Chung, Y. T.; Kuo, Y. K.; Liu, R. S.; Chan, T. S.; Chen, J. M.; Lee, J.-F.; Sheu, H.-S.; Wang, X. L.; Dou, S. X.; Lee, S. I.; Shi, Y. G.; Belik, A. A.; Yamaura, K.; Takayama-Muromachi, E.; Kaurav, N.; RU-SHI LIU |
| 臺大學術典藏 |
2018-09-10T07:23:40Z |
Inadvertent epidural spread after subpleural-paravertebral block with 0.5% bupivacaine.
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Chung, Y.T.;Sun, W.Z.;Lin, S.Y.;Huang, F.Y.; Chung, Y.T.; Sun, W.Z.; Lin, S.Y.; Huang, F.Y.; WEI-ZEN SUN |
| 臺大學術典藏 |
2018-09-10T04:26:16Z |
Left recurrent laryngeal nerve paralysis after interpleural analgesia [7]
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Chang, Y.; Chung, Y.-T.; WEI-ZEN SUN; Sun, W.-Z. |
| 臺大學術典藏 |
2018-09-10T03:24:45Z |
Subpleural block in patients with multiple rib fractures.
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Chung, Y.T.;Sun, W.Z.;Huang, F.Y.;Cheung, Y.F.; WEI-ZEN SUN |
| 國立交通大學 |
2017-04-21T06:48:58Z |
Investigation of Factors Affecting SET-Disturb Failure Time in a Resistive Switching Memory
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Su, P. C.; Chung, Y. T.; Chen, M. C.; Wang, Tahui |
| 國立交通大學 |
2014-12-08T15:36:52Z |
Investigation of Random Telegraph Noise Amplitudes in Hafnium Oxide Resistive Memory Devices
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Chung, Y. T.; Liu, Y. H.; Su, P. C.; Cheng, Y. H.; Wang, Tahui; Chen, M. C. |
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