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| 國立成功大學 |
2018-06-04 |
會計師權力與審計品質：來自中國的證據
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鍾岳庭; Chung, Yueh-Ting |
| 國立交通大學 |
2018-01-24T07:36:25Z |
電阻式記憶體及SONOS快閃式記憶體中介電層缺陷造成之可靠度效應研究
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鍾岳庭; 汪大暉; Chung, Yueh-Ting; Wang, Tahui |
| 國立交通大學 |
2017-04-21T06:56:32Z |
SET/RESET Cycling-Induced Trap Creation and SET-Disturb Failure Time Degradation in a Resistive-Switching Memory
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Chung, Yueh-Ting; Su, Po-Cheng; Lin, Wen-Jie; Chen, Min-Cheng; Wang, Tahui |
| 國立交通大學 |
2015-07-21T08:28:33Z |
Cycling-Induced SET-Disturb Failure Time Degradation in a Resistive Switching Memory
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Chung, Yueh-Ting; Su, Po-Cheng; Cheng, Yu-Hsuan; Wang, Tahui; Chen, Min-Cheng; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-12T01:46:10Z |
單一電子在SONOS快閃式記憶體中的現象，物理以及特性研究
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鍾岳庭; Chung, Yueh-Ting; 汪大暉; Wang, Ta-Hui |
| 國立交通大學 |
2014-12-08T15:22:37Z |
V-t Retention Distribution Tail in a Multitime-Program MLC SONOS Memory Due to a Random-Program-Charge-Induced Current-Path Percolation Effect
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Chung, Yueh-Ting; Huang, Tzu-I; Li, Chi-Wei; Chou, You-Liang; Chiu, Jung-Piao; Wang, Tahui; Lee, M. Y.; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:12:03Z |
A Novel Random Telegraph Signal Method to Study Program/Erase Charge Lateral Spread and Retention Loss in a SONOS Flash Memory
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Ma, Huan-Chi; Chou, You-Liang; Chiu, Jung-Piao; Chung, Yueh-Ting; Lin, Tung-Yang; Wang, Tahui; Chao, Yuan-Peng; Chen, Kuang-Chao; Lu, Chih-Yuan |
Showing items 1-7 of 7 (1 Page(s) Totally)
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