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Institution Date Title Author
國立交通大學 2014-12-12T01:24:29Z 可測試性設計與內建自我測試技術於有線等效保密智財之應用與研究 林隆裕; Lung-Yu Lin; 李崇仁; Chung-Len Lee
國立交通大學 2014-12-12T01:21:56Z 鎳矽化物應用在奈米金氧半導體元件技術之研究 李宗霖; Tsung-Lin Lee; 李崇仁; 雷添福; Chung-Len Lee; Tan-Fu Lei
中原大學 2000-09 Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits Hsing-Chung Liang;Chung Len Lee
中原大學 1997-09 Identifying Invalid States for Sequential Circuit Test Generation Hsing-Chung Liang;Chung Len Lee;Jwu E Chen
中原大學 1995-09 Identifying Untestable Faults in Sequential Circuits Hsing-Chung Liang;Chung Len Lee;Jwu E Chen
國立中山大學 1985-05 A Logic/Timing Simulator for Digital MOSIC Jyi-Tsong Lin;Chein-Wei Jen;Wen-Zen Shen;Chung-Len Lee

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