臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
南台科技大學	1996	SIMS Linescan Profiling of Chemically Bevelled Semiconductors : A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling	許進明; C.M. Hsu; D.S. McPhail
南台科技大學	1995	A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis	許進明; C. M. Hsu; D. S. McPhail
南台科技大學	1995	SIMS analysis of Al -doped GaAs test structures using chemical bevelling as a sample preparation technique	許進明; C.M. Hsu; V.K.M. Sharma; M.J. Ashwin; D.S. McPhail
南台科技大學	1994	A method of improving the SIMS analysis of Si in GaAs by monitoring SiO2− ions at oblique angles of bombardment	許進明; V.K.M. Skarma; D.S. McPhail; C.M. Hsu; M.R. Fahy

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