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机构 日期 题名 作者
國立交通大學 2019-04-02T05:59:14Z Charging damages to gate oxides in a helicon O-2 plasma Lin, W; Kang, TK; Perng, YC; Dai, BT; Cheng, HC
國立交通大學 2014-12-08T15:49:04Z A novel two-step etching to suppress the charging damages during metal etching employing helicon wave plasma Cheng, HC; Lin, W; Kang, TK; Perng, YC; Dai, BT
國立交通大學 2014-12-08T15:48:55Z Effects of helicon-wave-plasma etching on the charging damage of aluminum interconnects Lin, W; Kang, TK; Perng, YC; Dai, BT; Cheng, HC
國立交通大學 2014-12-08T15:46:11Z The novel improvement of low dielectric constant methylsilsesquioxane by N2O plasma treatment Chang, TC; Liu, PT; Mor, YS; Sze, SM; Yang, YL; Feng, MS; Pan, FM; Dai, BT; Chang, CY
國立交通大學 2014-12-08T15:46:08Z Nitric acid-based slurry with citric acid as an inhibitor for copper chemical mechanical polishing Hu, TC; Chiu, SY; Dai, BT; Tsai, MS; Tung, IC; Feng, MS
國立交通大學 2014-12-08T15:44:41Z Characterization of additive systems for damascene Cu electroplating by the superfilling profile monitor Chiu, SY; Shieh, JM; Chang, SC; Lin, KC; Dai, BT
國立交通大學 2014-12-08T15:43:56Z Characteristics of fluorinated amorphous carbon films and implementation of 0.15 mu m Cu/a-C : F damascene interconnection Shieh, JM; Suen, SC; Tsai, KC; Dai, BT; Wu, YC; Wu, YH
國立交通大學 2014-12-08T15:43:54Z Investigations of effects of bias polarization and chemical parameters on morphology and filling capability of 130 nm damascene electroplated copper Chang, SC; Shieh, JM; Lin, KC; Dai, BT; Wang, TC; Chen, CF; Feng, MS; Li, YH; Lu, CP
國立交通大學 2014-12-08T15:43:39Z Selective copper metallization by electrochemical contact displacement with amorphous silicon film Lee, YP; Tsai, MS; Hu, TC; Dai, BT; Feng, MS
國立交通大學 2014-12-08T15:42:47Z Electrochemical behavior of copper chemical mechanical polishing in KIO3 slurry Hsu, JW; Chiu, SY; Tsai, MS; Dai, BT; Feng, MS; Shih, HC

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